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                                       Details for article 97 of 115 found articles
 
 
  Research on ESD failure voltage model of the T-shaped wiring structure in GOA products
 
 
Title: Research on ESD failure voltage model of the T-shaped wiring structure in GOA products
Author: Yang, Borui
Fu, Guicui
Wan, Bo
Rong, Keyi
Wang, Ye
Li, Xin
Tian, Pengcheng
Li, Jian
Appeared in: Microelectronics reliability
Paging: Volume 138 () nr. C pages p.
Year: 2022
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 97 of 115 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands