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Journal description
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Details for article 96 of 115 found articles
| Title: |
Reliability estimation of complex systems based on a Wiener process with random effects and D-vine copulas |
| Author: |
Zheng, Bokai Chen, Cen Zhang, Wei Fu, Rao Hu, Yifan Lin, Yigang Wang, Chunqing Zhai, Guofu |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 138 () nr. C pages p. |
| Year: |
2022 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 96 of 115 found articles
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