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                                       Details for article 87 of 115 found articles
 
 
  Prediction of failure in time (FIT) of electrical connectors with short term tests
 
 
Title: Prediction of failure in time (FIT) of electrical connectors with short term tests
Author: Song, Jian
Shukla, Abhay
Probst, Roman
Appeared in: Microelectronics reliability
Paging: Volume 138 () nr. C pages p.
Year: 2022
Contents:
Publisher: The Authors
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 87 of 115 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands