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Journal description
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Details for article 64 of 115 found articles
| Title: |
Impact of negative bias temperature instability on p-channel power VDMOSFET used in practical applications |
| Author: |
Mitrović, N. Veljković, S. Davidović, V. Djorić-Veljković, S. Golubović, S. Živanović, E. Prijić, Z. Danković, D. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 138 () nr. C pages p. |
| Year: |
2022 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 64 of 115 found articles
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