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Journal description
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Details for article 4 of 27 found articles
| Title: |
An equivalent circuit model of HCI effect for short-channel N-MOSFET |
| Author: |
Zhang, Jun-an Hu, Jinxin Jiang, Min Xiao, Yi Li, Tiehu Lu, Yunhua Zhang, Qingwei |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 136 () nr. C pages p. |
| Year: |
2022 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 4 of 27 found articles
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