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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 29 of 34 found articles
| Title: |
The influence of the vibration test mode on the failure rate of electrical connectors |
| Author: |
Krüger, Kevin Yuan, Haomiao Song, Jian |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 135 () nr. C pages p. |
| Year: |
2022 |
| Contents: | |
| Publisher: |
The Author(s) |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 29 of 34 found articles
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