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Journal description
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Details for article 19 of 19 found articles
| Title: |
Wear-out failure analysis of modular multilevel converter-based STATCOM: The role of the modulation strategy and IGBT blocking voltage |
| Author: |
de Sousa, R.O. Cupertino, A.F. Morais, L.M.F. Pereira, H.A. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 128 () nr. C pages p. |
| Year: |
2022 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 19 of 19 found articles
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