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Journal description
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Details for article 18 of 19 found articles
| Title: |
Study on high power microwave nonlinear effects and degradation characteristics of C-band low noise amplifier |
| Author: |
Fuxing, Li Changchun, Chai Han, Wu Lei, Wang Qishuai, Liang Qi, An Yintang, Yang |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 128 () nr. C pages p. |
| Year: |
2022 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 18 of 19 found articles
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