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Journal description
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Details for article 19 of 111 found articles
| Title: |
Charge trapping in 0.1 μm AlGaN/GaN RF HEMTs: Dependence on barrier properties, voltage and temperature |
| Author: |
Chiocchetta, F. De Santi, C. Rampazzo, F. Meneghini, M. Meneghesso, G. Zanoni, E. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 126 () nr. C pages p. |
| Year: |
2021 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 19 of 111 found articles
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