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Journal description
All volumes of the corresponding journal
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Details for article 122 of 175 found articles
| Title: |
New definition of critical energy for SiC MOSFET robustness under short circuit operations: The repetitive critical energy |
| Author: |
Chen, C. Nguyen, T.A. Labrousse, D. Lefebvre, S. Buttay, C. Morel, H. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 114 () nr. C pages p. |
| Year: |
2020 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 122 of 175 found articles
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