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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
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Details for article 6 of 12 found articles
| Title: |
Electrical characterization of SiC MOS capacitors: A critical review |
| Author: |
Pande, Peyush Haasmann, Daniel Han, Jisheng Moghadam, Hamid Amini Tanner, Philip Dimitrijev, Sima |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 112 () nr. C pages p. |
| Year: |
2020 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 12 found articles
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