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Journal description
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Details for article 332 of 3017 found articles
| Title: |
Application of Scanning Microwave Microscopy nano-C-V to investigate dopant defect under a poly gate device |
| Author: |
Amster, O. Rubin, K.A. Yang, Y. Iyer, D. Messinger, A. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 88-90 (2018) nr. C pages 250-254 |
| Year: |
2018 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 332 of 3017 found articles
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