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Journal description
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Details for article 331 of 2999 found articles
| Title: |
Applications of the pulsed current-voltage (I-V) and capacitance-voltage (C-V) techniques for high-resistive gates in MOSFETs |
| Author: |
Lai, LiLung Wu, Xiaojing |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 63 (2016) nr. C pages 9 p. |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 331 of 2999 found articles
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