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An improved test methodology for detecting one-case latent damage in inverter circuit under ESD pulses |
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Title: |
An improved test methodology for detecting one-case latent damage in inverter circuit under ESD pulses |
Author: |
Qing, Yihong Han, Aoran Liao, Wenqian Chen, Le Yang, Zihan Du, Feibo Xie, Tiantian Wu, You-Lin Liu, Zhiwei Kaushik, Brajesh Kumar |
Appeared in: |
Microelectronics reliability |
Paging: |
Volume 134 () nr. C pages p. |
Year: |
2022 |
Contents: |
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Publisher: |
Elsevier Ltd |
Source file: |
Elektronische Wetenschappelijke Tijdschriften |
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