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Details for article 188 of 2999 found articles
| Title: |
Analysis of the charge sharing effect in the SET sensitivity of bulk 45 nm standard cell layouts under heavy ions |
| Author: |
Aguiar, Y.Q. Wrobel, F. Autran, J.-L. Leroux, P. Saigné, F. Touboul, A.D. Pouget, V. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 88-90 (2018) nr. C pages 920-924 |
| Year: |
2018 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 188 of 2999 found articles
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