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Details for article 64 of 551 found articles
| Title: |
Auger electron spectroscopy characterization of Ti/NiV/Ag multilayer back-metal for monitoring of Ni migration on Ag surface |
| Author: |
Ricciari, R. Ferlito, E.P. Pizzo, G. Padalino, M. Anastasi, G. Sacchi, M. Pappalardo, G. Consalvo, C. Mello, D. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 55 (2015) nr. 9-10 pages 5 p. |
| Year: |
2015 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 64 of 551 found articles
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