|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 76 of 123 found articles
| Title: |
Model for life prediction of fatigue–creep interaction |
| Author: |
Valentín, R. Barker, Donald Osterman, Michael |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 48 (2008) nr. 11-12 pages 6 p. |
| Year: |
2008 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 76 of 123 found articles
| << previous | next >> |