|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 75 of 123 found articles
| Title: |
Microdac — A novel approach to measure in situ deformation fields of microscopic scale |
| Author: |
Vogel, D. Schubert, A. Faust, W. Dudek, R. Michel, B. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 36 (1996) nr. 11-12 pages 1939-1942 |
| Year: |
1996 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 75 of 123 found articles
| << previous | next >> |