|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 5 of 13 found articles
| Title: |
Dependence on an oxide trap’s location of random telegraph noise (RTN) in GIDL current of n-MOSFET |
| Author: |
Nguyen Gia, Quan Yoo, Sung-Won Lee, Hyunseul Shin, Hyungcheol |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 92 (2014) nr. C pages 4 p. |
| Year: |
2014 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 5 of 13 found articles
| << previous | next >> |