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Details for article 1 of 26 found articles
| Title: |
A defect-based compact modeling approach for the reliability of CMOS devices and integrated circuits |
| Author: |
Esqueda, Ivan S. Barnaby, Hugh J. |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 91 (2014) nr. C pages 6 p. |
| Year: |
2014 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 26 found articles
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