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Journal description
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Details for article 2 of 29 found articles
| Title: |
Analysis of internal quantum efficiency and a new graphical evaluation scheme |
| Author: |
Hirsch, Michèle Rau, Uwe Werner, Jürgen H |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 38 (1995) nr. 5 pages 7 p. |
| Year: |
1995 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 29 found articles
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