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Journal description
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Details for article 7 of 21 found articles
| Title: |
Determination of the profile of the bulk generation lifetime from pulsed MOS-C transients |
| Author: |
Zhang, Xiumiao |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 35 (1992) nr. 2 pages 5 p. |
| Year: |
1992 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 7 of 21 found articles
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