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Journal description
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Details for article 2 of 16 found articles
| Title: |
A unified aging compact model for hot carrier degradation under mixed-mode and reverse E-B stress in complementary SiGe HBTs |
| Author: |
Mukherjee, C. Fischer, G.G. Marc, F. Couret, M. Zimmer, T. Maneux, C. |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 172 () nr. C pages p. |
| Year: |
2020 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 16 found articles
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