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  Abnormal double-hump phenomenon in amorphous In-Ga-Zn-O thin-film transistor under positive gate bias temperature stress
 
 
Title: Abnormal double-hump phenomenon in amorphous In-Ga-Zn-O thin-film transistor under positive gate bias temperature stress
Author: Kim, Yongjo
Ha, Tae-Kyoung
Yu, SangHee
Kim, GwangTae
Jeong, Hoon
Park, JeongKi
Kim, Ohyun
Appeared in: Solid-state electronics
Paging: Volume 172 () nr. C pages p.
Year: 2020
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

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