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                                       Details for article 7 of 30 found articles
 
 
  Characterization of the interface-driven 1st Reset operation in HfO2-based 1T1R RRAM devices
 
 
Title: Characterization of the interface-driven 1st Reset operation in HfO2-based 1T1R RRAM devices
Author: Pérez, Eduardo
Mahadevaiah, Mamathamba Kalishettyhalli
Zambelli, Cristian
Olivo, Piero
Wenger, Christian
Appeared in: Solid-state electronics
Paging: Volume 159 (2019) nr. C pages 51-56
Year: 2019
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 7 of 30 found articles
 
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