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Journal description
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Details for article 6 of 30 found articles
| Title: |
Characterization and modeling of 28-nm FDSOI CMOS technology down to cryogenic temperatures |
| Author: |
Beckers, Arnout Jazaeri, Farzan Bohuslavskyi, Heorhii Hutin, Louis De Franceschi, Silvano Enz, Christian |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 159 (2019) nr. C pages 106-115 |
| Year: |
2019 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 30 found articles
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