Effect of barrier recess on transport and electrostatic interface properties of GaN-based normally-off and normally-on metal oxide semiconductor heterostructure field effect transistors
Titel:
Effect of barrier recess on transport and electrostatic interface properties of GaN-based normally-off and normally-on metal oxide semiconductor heterostructure field effect transistors
Auteur:
Capriotti, M. Bahat Treidel, E. Fleury, C. Bethge, O. Ostermaier, C. Rigato, M. Lancaster, S.L.C. Brunner, F. Detz, H. Hilt, O. Würfl, J. Pogany, D. Strasser, G.