|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 21 of 74 found articles
| Title: |
Characterizing damage to ONO dielectrics induced during programming SONOS/NROMTM non-volatile semiconductor memory (NVSM) devices |
| Author: |
Wrazien, Stephen J. Wang, Yu Khan, Bilal M. White, Marvin H. |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 48 (2004) nr. 10-11 pages 5 p. |
| Year: |
2004 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 21 of 74 found articles
| << previous | next >> |