nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Active Air Venting of Mold Cavity to Improve Performance of Injection Molded Direct Joining
|
Kimura, Fuminobu |
|
|
|
2 |
p. 109-117 |
artikel |
2 |
A Design Study of a Heat Flow-Type Reading Head for a Linear Encoder Based on a Micro Thermal Sensor
|
Shimizu, Yuki |
|
2019 |
|
2 |
p. 100-110 |
artikel |
3 |
AFM Measurements and Tip Characterization of Nanoparticles with Different Shapes
|
Bellotti, Roberto |
|
|
|
2 |
p. 127-138 |
artikel |
4 |
Analysis of Line-Edge Roughness Using EUV Scatterometry
|
Fernández Herrero, Analía |
|
|
|
2 |
p. 149-158 |
artikel |
5 |
An Investigation of Effect of Stand-Off Distance on the Material Removal Characteristics and Surface Generation in Fluid Jet Polishing
|
Wang, Chun Jin |
|
|
|
2 |
p. 112-122 |
artikel |
6 |
Anisotropy-Related Machining Characteristics in Ultra-Precision Diamond Cutting of Crystalline Copper
|
Wang, Zhanfeng |
|
|
|
2 |
p. 123-132 |
artikel |
7 |
A Proposal of a Spline Filter that Achieves Both Robustness and Lower Compatibility
|
Kondo, Yuki |
|
|
|
2 |
p. 77-85 |
artikel |
8 |
A Proposal of Hyperbolic Fitting Method by Applying the Properties of Functions for Plateau Surface Analysis in ISO 13565-3
|
Sakakibara, Ryo |
|
|
|
2 |
p. 86-96 |
artikel |
9 |
Atomic Force Microscope with an Adjustable Probe Direction and Integrated Sensing and Actuation
|
Schaude, Janik |
|
|
|
2 |
p. 139-148 |
artikel |
10 |
Automatic Measurement of Silicon Lattice Spacings in High-Resolution Transmission Electron Microscopy Images Through 2D Discrete Fourier Transform and Inverse Discrete Fourier Transform
|
Wang, Fang |
|
|
|
2 |
p. 119-126 |
artikel |
11 |
Comparison of EUV Photomask Metrology Between CD-AFM and TEM
|
Dai, Gaoliang |
|
|
|
2 |
p. 91-100 |
artikel |
12 |
Design and Development of Oblique-Incident Interferometer for Form Measurement of Hand-Scraped Surfaces
|
Ito, So |
|
|
|
2 |
p. 69-76 |
artikel |
13 |
Design of a Multi-sensor Monitoring System for Additive Manufacturing Process
|
Peng, Xing |
|
|
|
2 |
p. 142-150 |
artikel |
14 |
3D Identification of Face and Flank in Micro-mills for Automatic Measurement of Rake Angle
|
Petrò, Stefano |
|
|
|
2 |
p. 151-163 |
artikel |
15 |
DMPFIT: A Tool for Atomic-Scale Metrology via Nonlinear Least-Squares Fitting of Peaks in Atomic-Resolution TEM Images
|
Du, Hongchu |
|
|
|
2 |
p. 101-111 |
artikel |
16 |
Effects of Topography and Modified Layer by Plasma-Shot Treatment on High-Speed Steel
|
Shibata, Yorihito |
|
|
|
2 |
p. 133-141 |
artikel |
17 |
Foreword to the Special Issue on Atomic and Close-to-Atomic Scale Metrology
|
Dai, Gaoliang |
|
|
|
2 |
p. 81-82 |
artikel |
18 |
Foreword to the Special Issue on Micro- and Nano-Metrology in Japan (II)
|
Shimizu, Yuki |
|
|
|
2 |
p. 67-68 |
artikel |
19 |
Generating Nanodot Structures on Stainless-Steel Surfaces by Cross Scanning of a Picosecond Pulsed Laser
|
Kobayashi, Tomoki |
|
|
|
2 |
p. 105-111 |
artikel |
20 |
In-Process Measurement of Thickness of Cured Resin in Evanescent-Wave-Based Nano-stereolithography Using Critical Angle Reflection
|
Kong, Deqing |
|
2018 |
|
2 |
p. 112-124 |
artikel |
21 |
Instrumented Indentation Test in the Nano-range: Performances Comparison of Testing Machines Calibration Methods
|
Galetto, Maurizio |
|
2019 |
|
2 |
p. 91-99 |
artikel |
22 |
Investigation on Innovative Dynamic Cutting Force Modelling in Micro-milling and Its Experimental Validation
|
Niu, Zhichao |
|
2018 |
|
2 |
p. 82-95 |
artikel |
23 |
Measurement of 3-DOF Planar Motion of the Object Based on Image Segmentation and Matching
|
Yang, Shuming |
|
2019 |
|
2 |
p. 124-129 |
artikel |
24 |
Nanometer-Order Contouring Control in a Feed Drive System Using Linear Ball Guides by Applying a Combination of Modified Disturbance Observer and Repetitive Control
|
Ohashi, Tomofumi |
|
|
|
2 |
p. 118-129 |
artikel |
25 |
Origins of Ultrafast Pulse Laser-Induced Nano Straight Lines with Potential Applications in Detecting Subsurface Defects in Silicon Carbide Wafers
|
Shu, Tan |
|
|
|
2 |
p. 167-178 |
artikel |
26 |
Polarization Measurement Method Based on Liquid Crystal Variable Retarder (LCVR) for Atomic Thin-Film Thickness
|
Yuan, Yucong |
|
|
|
2 |
p. 159-166 |
artikel |
27 |
Precision Optics Manufacturing and Control for Next-Generation Large Telescopes
|
Graves, Logan R. |
|
2019 |
|
2 |
p. 65-90 |
artikel |
28 |
Promising Lithography Techniques for Next-Generation Logic Devices
|
Hasan, Rashed Md. Murad |
|
2018 |
|
2 |
p. 67-81 |
artikel |
29 |
Reduction in Cross-Talk Errors in a Six-Degree-of-Freedom Surface Encoder
|
Matsukuma, Hiraku |
|
2019 |
|
2 |
p. 111-123 |
artikel |
30 |
Research Activities of Nanodimensional Standards Using Atomic Force Microscopes, Transmission Electron Microscope, and Scanning Electron Microscope at the National Metrology Institute of Japan
|
Misumi, Ichiko |
|
|
|
2 |
p. 83-90 |
artikel |
31 |
Scanning and Splicing Atom Lithography for Self-traceable Nanograting Fabrication
|
Deng, Xiao |
|
|
|
2 |
p. 179-187 |
artikel |
32 |
Slice Thickness Optimization for the Focused Ion Beam-Scanning Electron Microscopy 3D Tomography of Hierarchical Nanoporous Gold
|
Shkurmanov, Alexander |
|
|
|
2 |
p. 112-118 |
artikel |
33 |
Surface Quality Evaluation in Orthogonal Turn-Milling Based on Box-Counting Method for Image Fractal Dimension Estimation
|
Niu, Zhongke |
|
2018 |
|
2 |
p. 125-130 |
artikel |
34 |
The Influence of Ni Addition on the Microstructures and Mechanical Properties of Al2O3–TiN–TiC Ceramic Materials
|
Fei, Yuhuan |
|
2018 |
|
2 |
p. 105-111 |
artikel |
35 |
Uncertainty and Resolution of Speckle Photography on Micro Samples
|
Alexe, Gabriela |
|
|
|
2 |
p. 91-104 |
artikel |
36 |
Verification of Characteristics of Gaussian Filter Series for Surface Roughness in ISO and Proposal of Filter Selection Guidelines
|
Kondo, Yuki |
|
|
|
2 |
p. 97-108 |
artikel |
37 |
Wear Mechanisms of Ceramic Vibratory Finishing Media
|
Uhlmann, Eckart |
|
2018 |
|
2 |
p. 96-104 |
artikel |