Digitale Bibliotheek
Sluiten Bladeren door artikelen uit een tijdschrift
     Tijdschrift beschrijving
       Alle jaargangen van het bijbehorende tijdschrift
         Alle afleveringen van het bijbehorende jaargang
                                       Alle artikelen van de bijbehorende aflevering
 
                             37 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Active Air Venting of Mold Cavity to Improve Performance of Injection Molded Direct Joining Kimura, Fuminobu

2 p. 109-117
artikel
2 A Design Study of a Heat Flow-Type Reading Head for a Linear Encoder Based on a Micro Thermal Sensor Shimizu, Yuki
2019
2 p. 100-110
artikel
3 AFM Measurements and Tip Characterization of Nanoparticles with Different Shapes Bellotti, Roberto

2 p. 127-138
artikel
4 Analysis of Line-Edge Roughness Using EUV Scatterometry Fernández Herrero, Analía

2 p. 149-158
artikel
5 An Investigation of Effect of Stand-Off Distance on the Material Removal Characteristics and Surface Generation in Fluid Jet Polishing Wang, Chun Jin

2 p. 112-122
artikel
6 Anisotropy-Related Machining Characteristics in Ultra-Precision Diamond Cutting of Crystalline Copper Wang, Zhanfeng

2 p. 123-132
artikel
7 A Proposal of a Spline Filter that Achieves Both Robustness and Lower Compatibility Kondo, Yuki

2 p. 77-85
artikel
8 A Proposal of Hyperbolic Fitting Method by Applying the Properties of Functions for Plateau Surface Analysis in ISO 13565-3 Sakakibara, Ryo

2 p. 86-96
artikel
9 Atomic Force Microscope with an Adjustable Probe Direction and Integrated Sensing and Actuation Schaude, Janik

2 p. 139-148
artikel
10 Automatic Measurement of Silicon Lattice Spacings in High-Resolution Transmission Electron Microscopy Images Through 2D Discrete Fourier Transform and Inverse Discrete Fourier Transform Wang, Fang

2 p. 119-126
artikel
11 Comparison of EUV Photomask Metrology Between CD-AFM and TEM Dai, Gaoliang

2 p. 91-100
artikel
12 Design and Development of Oblique-Incident Interferometer for Form Measurement of Hand-Scraped Surfaces Ito, So

2 p. 69-76
artikel
13 Design of a Multi-sensor Monitoring System for Additive Manufacturing Process Peng, Xing

2 p. 142-150
artikel
14 3D Identification of Face and Flank in Micro-mills for Automatic Measurement of Rake Angle Petrò, Stefano

2 p. 151-163
artikel
15 DMPFIT: A Tool for Atomic-Scale Metrology via Nonlinear Least-Squares Fitting of Peaks in Atomic-Resolution TEM Images Du, Hongchu

2 p. 101-111
artikel
16 Effects of Topography and Modified Layer by Plasma-Shot Treatment on High-Speed Steel Shibata, Yorihito

2 p. 133-141
artikel
17 Foreword to the Special Issue on Atomic and Close-to-Atomic Scale Metrology Dai, Gaoliang

2 p. 81-82
artikel
18 Foreword to the Special Issue on Micro- and Nano-Metrology in Japan (II) Shimizu, Yuki

2 p. 67-68
artikel
19 Generating Nanodot Structures on Stainless-Steel Surfaces by Cross Scanning of a Picosecond Pulsed Laser Kobayashi, Tomoki

2 p. 105-111
artikel
20 In-Process Measurement of Thickness of Cured Resin in Evanescent-Wave-Based Nano-stereolithography Using Critical Angle Reflection Kong, Deqing
2018
2 p. 112-124
artikel
21 Instrumented Indentation Test in the Nano-range: Performances Comparison of Testing Machines Calibration Methods Galetto, Maurizio
2019
2 p. 91-99
artikel
22 Investigation on Innovative Dynamic Cutting Force Modelling in Micro-milling and Its Experimental Validation Niu, Zhichao
2018
2 p. 82-95
artikel
23 Measurement of 3-DOF Planar Motion of the Object Based on Image Segmentation and Matching Yang, Shuming
2019
2 p. 124-129
artikel
24 Nanometer-Order Contouring Control in a Feed Drive System Using Linear Ball Guides by Applying a Combination of Modified Disturbance Observer and Repetitive Control Ohashi, Tomofumi

2 p. 118-129
artikel
25 Origins of Ultrafast Pulse Laser-Induced Nano Straight Lines with Potential Applications in Detecting Subsurface Defects in Silicon Carbide Wafers Shu, Tan

2 p. 167-178
artikel
26 Polarization Measurement Method Based on Liquid Crystal Variable Retarder (LCVR) for Atomic Thin-Film Thickness Yuan, Yucong

2 p. 159-166
artikel
27 Precision Optics Manufacturing and Control for Next-Generation Large Telescopes Graves, Logan R.
2019
2 p. 65-90
artikel
28 Promising Lithography Techniques for Next-Generation Logic Devices Hasan, Rashed Md. Murad
2018
2 p. 67-81
artikel
29 Reduction in Cross-Talk Errors in a Six-Degree-of-Freedom Surface Encoder Matsukuma, Hiraku
2019
2 p. 111-123
artikel
30 Research Activities of Nanodimensional Standards Using Atomic Force Microscopes, Transmission Electron Microscope, and Scanning Electron Microscope at the National Metrology Institute of Japan Misumi, Ichiko

2 p. 83-90
artikel
31 Scanning and Splicing Atom Lithography for Self-traceable Nanograting Fabrication Deng, Xiao

2 p. 179-187
artikel
32 Slice Thickness Optimization for the Focused Ion Beam-Scanning Electron Microscopy 3D Tomography of Hierarchical Nanoporous Gold Shkurmanov, Alexander

2 p. 112-118
artikel
33 Surface Quality Evaluation in Orthogonal Turn-Milling Based on Box-Counting Method for Image Fractal Dimension Estimation Niu, Zhongke
2018
2 p. 125-130
artikel
34 The Influence of Ni Addition on the Microstructures and Mechanical Properties of Al2O3–TiN–TiC Ceramic Materials Fei, Yuhuan
2018
2 p. 105-111
artikel
35 Uncertainty and Resolution of Speckle Photography on Micro Samples Alexe, Gabriela

2 p. 91-104
artikel
36 Verification of Characteristics of Gaussian Filter Series for Surface Roughness in ISO and Proposal of Filter Selection Guidelines Kondo, Yuki

2 p. 97-108
artikel
37 Wear Mechanisms of Ceramic Vibratory Finishing Media Uhlmann, Eckart
2018
2 p. 96-104
artikel
                             37 gevonden resultaten
 
 Koninklijke Bibliotheek - Nationale Bibliotheek van Nederland