nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A Hermetic Seal Using Composite Thin-Film In/Sn Solder as an Intermediate Layer and Its Interdiffusion Reaction with Cu
|
Yan, Li-ling |
|
2008 |
38 |
1 |
p. 200-207 |
artikel |
2 |
A Study on a Surface Preparation Method for Single-Crystal SiC Using an Fe Catalyst
|
Kubota, Akihisa |
|
2008 |
38 |
1 |
p. 159-163 |
artikel |
3 |
Ceramic Substrates for High-temperature Electronic Integration
|
Chasserio, N. |
|
2008 |
38 |
1 |
p. 164-174 |
artikel |
4 |
Cu-Ni-Sn: A Key System for Lead-Free Soldering
|
Schmetterer, C. |
|
2008 |
38 |
1 |
p. 10-24 |
artikel |
5 |
Effect of Cu Thickness on the Evolution of the Reaction Products at the Sn-9wt.%Zn Solder/Cu Interface During Reflow
|
Chen, Chih-hao |
|
2008 |
38 |
1 |
p. 61-69 |
artikel |
6 |
Effect of Electromigration on the Mechanical Performance of Sn-3.5Ag Solder Joints with Ni and Ni-P Metallizations
|
Kumar, Aditya |
|
2008 |
38 |
1 |
p. 78-87 |
artikel |
7 |
Effect of Ni-Cr Layer on Adhesion Strength of Flexible Copper Clad Laminate
|
Noh, Bo-In |
|
2008 |
38 |
1 |
p. 46-53 |
artikel |
8 |
Effects of Co Addition on Bulk Properties of Sn-3.5Ag Solder and Interfacial Reactions with Ni-P UBM
|
Kim, Dong Hoon |
|
2008 |
38 |
1 |
p. 39-45 |
artikel |
9 |
Electromigration Behavior in Sn-37Pb and Sn-3.0Ag-0.5Cu Flip-Chip Solder Joints under High Current Density
|
Ha, Sang-Su |
|
2008 |
38 |
1 |
p. 70-77 |
artikel |
10 |
Fabrication of Mesa Shaped InGaN-Based Light-Emitting Diodes Through a Photoelectrochemical Process
|
Yang, Chung-Chieh |
|
2008 |
38 |
1 |
p. 145-152 |
artikel |
11 |
Factors That Govern the Performance of Thermal Interface Materials
|
Pour Shahid Saeed Abadi, Parisa |
|
2008 |
38 |
1 |
p. 175-192 |
artikel |
12 |
Foreword
|
Chen, Sinn-wen |
|
2008 |
38 |
1 |
p. 1 |
artikel |
13 |
Improvement of Thermal Fatigue Properties of Sn-Ag-Cu Lead-Free Solder Interconnects on Casio’s Wafer-Level Packages Based on Morphology and Grain Boundary Character
|
Terashima, S. |
|
2008 |
38 |
1 |
p. 33-38 |
artikel |
14 |
Interfacial Reaction and Wetting Behavior Between Pt and Molten Solder
|
Yang, S.C. |
|
2008 |
38 |
1 |
p. 25-32 |
artikel |
15 |
Interfacial Reaction between Zn-Al-Based High-Temperature Solders and Ni Substrate
|
Takaku, Yoshikazu |
|
2008 |
38 |
1 |
p. 54-60 |
artikel |
16 |
Interfacial Reactions Between Pb-Free Solders and In/Ni/Cu Multilayer Substrates
|
Yen, Yee-Wen |
|
2008 |
38 |
1 |
p. 93-99 |
artikel |
17 |
Microstructural Evolution of Alloy Powder for Electronic Materials with Liquid Miscibility Gap
|
Ohnuma, I. |
|
2008 |
38 |
1 |
p. 2-9 |
artikel |
18 |
Multiple-Scale Analysis of Charge Transport in Semiconductor Radiation Detectors: Application to Semi-Insulating CdZnTe
|
Bale, Derek S. |
|
2008 |
38 |
1 |
p. 126-144 |
artikel |
19 |
Nearly Perfect Electrical Activation Efficiencies from Silicon-Implanted AlxGa1−xN with High Aluminum Mole Fraction
|
Moore, E.A. |
|
2008 |
38 |
1 |
p. 153-158 |
artikel |
20 |
Optical Characteristics of ZnTeO Thin Films Synthesized by Pulsed Laser Deposition and Molecular Beam Epitaxy
|
Wang, W. |
|
2008 |
38 |
1 |
p. 119-125 |
artikel |
21 |
Phase Transitions in the BiVO4-nPbO (n = 1, 2) System: Structural–Electrical Properties Relationships
|
Wignacourt, Jean-Pierre |
|
2008 |
38 |
1 |
p. 113-118 |
artikel |
22 |
Reflectivity and Abnormal Absorption at ITO/Al Interface
|
Lin, Y.H. |
|
2008 |
38 |
1 |
p. 108-112 |
artikel |
23 |
Simulation, Modeling, and Crystal Growth of Cd0.9Zn0.1Te for Nuclear Spectrometers
|
Mandal, Krishna C. |
|
2008 |
38 |
1 |
p. 208 |
artikel |
24 |
Suppressing Growth of the Cu5Zn8 Intermetallic Layer in Sn-Zn-Ag-Al-Ga/Cu Solder Joints
|
Lai, R. S. |
|
2008 |
38 |
1 |
p. 88-92 |
artikel |
25 |
Synthesis of Nanostructured Carbon Materials on a Tin Thin Film Using Phenol Formaldehyde as the Carbon Source
|
Chen, Chih-ming |
|
2008 |
38 |
1 |
p. 193-199 |
artikel |
26 |
Thermal Stability Study of Cu(MoNx) Seed Layer on Barrierless Si
|
Chu, J.P. |
|
2008 |
38 |
1 |
p. 100-107 |
artikel |