| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Atom probe tomography analysis of SiGe fins embedded in SiO2: Facts and artefacts
|
Melkonyan, D.
|
|
2017
|
179 |
C |
p. 100-107
|
artikel
|
| 2 |
Comment on, “On the influence of the electron dose-rate on the HRTEM image contrast”, by Juri Barthel, Markus Lentzen, Andreas Thust, ULTRAM12246 (2016), http://dx.doi.org/10.1016/j.ultramic.2016.11.016
|
Kisielowski, C.
|
|
2017
|
179 |
C |
p. 108-112
|
artikel
|
| 3 |
Compressed sensing for STEM tomography
|
Donati, Laurène
|
|
2017
|
179 |
C |
p. 47-56
|
artikel
|
| 4 |
Consequences of the CMR effect on EELS in TEM
|
Wallisch, Wolfgang
|
|
2017
|
179 |
C |
p. 84-89
|
artikel
|
| 5 |
Development of compact Cs corrector for desktop electron microscope
|
Chang, Wei-Yu
|
|
2017
|
179 |
C |
p. 94-99
|
artikel
|
| 6 |
Editorial Board
|
|
|
2017
|
179 |
C |
p. IFC
|
artikel
|
| 7 |
EMCD with an electron vortex filter: Limitations and possibilities
|
Schachinger, T.
|
|
2017
|
179 |
C |
p. 15-23
|
artikel
|
| 8 |
Focused ion beam-assisted fabrication of soft high-aspect ratio silicon nanowire atomic force microscopy probes
|
Knittel, Peter
|
|
2017
|
179 |
C |
p. 24-32
|
artikel
|
| 9 |
Non-contact scanning probe technique for electric field measurements based on nanowire field-effect transistor
|
Trifonov, A.S.
|
|
2017
|
179 |
C |
p. 33-40
|
artikel
|
| 10 |
Note on in situ (scanning) transmission electron microscopy study of liquid samples
|
Jiang, Nan
|
|
2017
|
179 |
C |
p. 81-83
|
artikel
|
| 11 |
On the role of the second-order derivative term in the calculation of convergent beam diffraction patterns
|
Hillier, S.C.
|
|
2017
|
179 |
C |
p. 73-80
|
artikel
|
| 12 |
Optimising multi-frame ADF-STEM for high-precision atomic-resolution strain mapping
|
Jones, Lewys
|
|
2017
|
179 |
C |
p. 57-62
|
artikel
|
| 13 |
Response to the comment by C. Kisielowski, H.A. Calderon, F.R. Chen, S. Helveg, J.R. Jinschek, P. Specht, D. Van Dyck on the article “On the influence of the electron dose-rate on the HRTEM image contrast” by J. Barthel, M. Lentzen, A. Thust, Ultramicroscopy 176 (2017) 37–45
|
Barthel, Juri
|
|
2017
|
179 |
C |
p. 113-115
|
artikel
|
| 14 |
Statistical analysis of dislocations and dislocation boundaries from EBSD data
|
Moussa, C.
|
|
2017
|
179 |
C |
p. 63-72
|
artikel
|
| 15 |
Super-resolved 3-D imaging of live cells’ organelles from bright-field photon transmission micrographs
|
Rychtáriková, Renata
|
|
2017
|
179 |
C |
p. 1-14
|
artikel
|
| 16 |
Switchable bi-stable multilayer magnetic probes for imaging of soft magnetic structures
|
Wren, Tom
|
|
2017
|
179 |
C |
p. 41-46
|
artikel
|
| 17 |
Vacuum scanning capillary photoemission microscopy
|
Aseyev, S.A.
|
|
2017
|
179 |
C |
p. 90-93
|
artikel
|
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