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                             119 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A comparative study of PIXE and XRF corrected by Gamma-Ray Transmission for the non-destructive characterization of a gilded roman railing Ortega-Feliu, I.
 2010
 11-12 p. 1920-1923
4 p.
 artikel
2 Aging of ErT2 thin films: ERD analysis and mechanical property changes Knapp, J.A.
 2010
 11-12 p. 2141-2143
3 p.
 artikel
3 Analysis of human hair cross sections from two different population groups by Nuclear Microscopy Pineda-Vargas, C.A.
 2010
 11-12 p. 2164-2167
4 p.
 artikel
4 A new cluster-ion-beam source for secondary ion mass spectrometry (SIMS) using the electrospray of a pure ionic liquid under high vacuum Fujiwara, Yukio
 2010
 11-12 p. 1938-1941
4 p.
 artikel
5 A new ion beam analysis data format Barradas, N.P.
 2010
 11-12 p. 1824-1828
5 p.
 artikel
6 A new mapping acquisition and processing system for simultaneous PIXE-RBS analysis with external beam Pichon, L.
 2010
 11-12 p. 2028-2033
6 p.
 artikel
7 Annealing of ion implanted 4H–SiC in the temperature range of 100–800°C analysed by ion beam techniques Usman, M.
 2010
 11-12 p. 2083-2085
3 p.
 artikel
8 A pre-sample charge measurement system for quantitative NMP-analysis Kristiansson, P.
 2010
 11-12 p. 1727-1730
4 p.
 artikel
9 Argon plasma irradiation of polypropylene Slepička, P.
 2010
 11-12 p. 2111-2114
4 p.
 artikel
10 A TEM investigation of retained defects in Si wafer by 1MeV Si ions bombardment Hsu, J.Y.
 2010
 11-12 p. 2193-2196
4 p.
 artikel
11 Author Index Proceedings 2010
 11-12 p. I-XII
nvt p.
 artikel
12 Boron lattice site location in (BGa)As and (BGa)P thin films studied using RBS and NRA with a channeled He+ ion beam Spemann, D.
 2010
 11-12 p. 2069-2073
5 p.
 artikel
13 Cd induced redistribution of elements within leaves of the Cd/Zn hyperaccumulator Thlaspi praecox as revealed by micro-PIXE Pongrac, Paula
 2010
 11-12 p. 2205-2210
6 p.
 artikel
14 CdTe detector use for PIXE characterization of TbCoFe thin films Chaves, P.C.
 2010
 11-12 p. 2010-2014
5 p.
 artikel
15 Characterisation of annealed Fe/Ag bilayers by RBS and XRD Tunyogi, A.
 2010
 11-12 p. 1972-1975
4 p.
 artikel
16 Combined PIXE/PIGE and IBIL with external beam applied to the analysis of Merovingian glass beads Mathis, F.
 2010
 11-12 p. 2078-2082
5 p.
 artikel
17 Committees 2010
 11-12 p. vi-
1 p.
 artikel
18 Contribution of ion beam analysis methods to the development of second generation high temperature superconducting wires Usov, I.O.
 2010
 11-12 p. 2046-2050
5 p.
 artikel
19 Damage recovery in ZnO by post-implantation annealing Audren, A.
 2010
 11-12 p. 1842-1846
5 p.
 artikel
20 Defect studies in ion irradiated AlGaN Jagielski, J.
 2010
 11-12 p. 2056-2059
4 p.
 artikel
21 Depth profiling of fingerprint and ink signals by SIMS and MeV SIMS Bailey, M.J.
 2010
 11-12 p. 1929-1932
4 p.
 artikel
22 Depth-profiling of implanted 28Si by (α,α) and (α,p0) reactions Demarche, J.
 2010
 11-12 p. 2107-2110
4 p.
 artikel
23 Detection of beryllium treatment of natural sapphires by NRA Gutiérrez, P.C.
 2010
 11-12 p. 2038-2041
4 p.
 artikel
24 Determination of 13C/12C ratios with (d,p) nuclear reactions Wang, Y.Q.
 2010
 11-12 p. 2099-2103
5 p.
 artikel
25 Determination of differential cross-sections for the natK(p, p 0) and 39K(p, α 0) reactions in the backscattering geometry Kokkoris, M.
 2010
 11-12 p. 1797-1801
5 p.
 artikel
26 Determination of lattice orientation in aluminium alloy grains by low energy gallium ion-channelling Silk, Jonathan R.
 2010
 11-12 p. 2064-2068
5 p.
 artikel
27 Determination of tetragonal distortion of Al0.69In0.09Ga0.22N/GaN heterostructure by RBS/C and HRXRD Fa, T.
 2010
 11-12 p. 1871-1874
4 p.
 artikel
28 Development of a TOF-ERDA measurement system for analysis of light elements using a He beam Yasuda, K.
 2010
 11-12 p. 2023-2027
5 p.
 artikel
29 Development of laboratory standards for AMS measurement of 237Np Wang, Xianggao
 2010
 11-12 p. 1949-1953
5 p.
 artikel
30 DIADDHEM set-up: New IBA facility for studying the helium behavior in nuclear glasses Chamssedine, F.
 2010
 11-12 p. 1862-1866
5 p.
 artikel
31 Editorial board 2010
 11-12 p. IFC-
1 p.
 artikel
32 Effect of ion irradiation on structure and thermal evolution of the Ni–C60 hybrid systems Vacik, J.
 2010
 11-12 p. 1976-1979
4 p.
 artikel
33 Effect of the Bethe surface description on the electronic excitations induced by energetic proton beams in liquid water and DNA Abril, Isabel
 2010
 11-12 p. 1763-1767
5 p.
 artikel
34 Effect of vacancy de-excitation parameters on L X-rays of Pb using H+ beam Jain, Arvind Kumar
 2010
 11-12 p. 1790-1792
3 p.
 artikel
35 Effects of the projectile electronic structure on Bethe–Bloch stopping parameters for Ag Moussa, D.
 2010
 11-12 p. 1754-1758
5 p.
 artikel
36 Elastic scattering of 7Li+ 27Al at several angles in the 7–11MeV energy range Abriola, D.
 2010
 11-12 p. 1793-1796
4 p.
 artikel
37 Energy and depth resolution in elastic recoil coincidence spectrometry Szilágyi, E.
 2010
 11-12 p. 1731-1735
5 p.
 artikel
38 Energy loss of protons in carbon nanotubes: Experiments and calculations Kyriakou, I.
 2010
 11-12 p. 1781-1785
5 p.
 artikel
39 ERD analysis and modification of TiO2 thin films with heavy ions Jensen, J.
 2010
 11-12 p. 1893-1898
6 p.
 artikel
40 Erosion and re-deposition processes in JET tiles studied with ion beams Alves, L.C.
 2010
 11-12 p. 1991-1996
6 p.
 artikel
41 Evaluated differential cross-sections for IBA Gurbich, A.F.
 2010
 11-12 p. 1703-1710
8 p.
 artikel
42 Evaluation of soft error rates using nuclear probes in bulk and SOI SRAMs with a technology node of 90nm Abo, Satoshi
 2010
 11-12 p. 2074-2077
4 p.
 artikel
43 Evaluation of zinc interstitial in Si-ion implanted ZnO bulk single crystals by a Rutherford backscattering study: An origin of low resistivity Izawa, Y.
 2010
 11-12 p. 2104-2106
3 p.
 artikel
44 Evolution of Zr/Hf/Zr trilayers during annealing studied by RBS Kling, A.
 2010
 11-12 p. 1853-1856
4 p.
 artikel
45 Experimental stopping powers of Al, Mg, F and O ions in ZrO2 in the 0.1–0.6MeV/u energy range Msimanga, M.
 2010
 11-12 p. 1772-1775
4 p.
 artikel
46 External beamline setup for plated target investigation Jezeršek, David
 2010
 11-12 p. 2006-2009
4 p.
 artikel
47 External scanning micro-PIXE for the characterization of a polycapillary lens: Measurement of the collected X-ray intensity distribution Grassi, N.
 2010
 11-12 p. 1945-1948
4 p.
 artikel
48 First results on ion micro-tomography at LIPSION Rothermel, M.
 2010
 11-12 p. 2001-2005
5 p.
 artikel
49 Grazing angle 2MeV RBS on the surface of a liquid with atomic layer depth resolution Hess, M.
 2010
 11-12 p. 1711-1713
3 p.
 artikel
50 Helium release in uranium dioxide in relation to grain boundaries and free surfaces Martin, G.
 2010
 11-12 p. 2133-2137
5 p.
 artikel
51 High Resolution and Differential PIXE combined with RBS, EBS and AFM analysis of magnesium titanate (MgTiO3) multilayer structures Reis, M.A.
 2010
 11-12 p. 1980-1985
6 p.
 artikel
52 Identification and characterization of fine and coarse particulate matter sources in a middle-European urban environment Kertész, Zs.
 2010
 11-12 p. 1924-1928
5 p.
 artikel
53 Impurity mapping in sulphide minerals using Time-resolved Ion Beam Induced Current imaging Laird, Jamie S.
 2010
 11-12 p. 1903-1910
8 p.
 artikel
54 Influence of temperature and plasma composition on deuterium retention in refractory metals Alves, E.
 2010
 11-12 p. 2124-2128
5 p.
 artikel
55 Influence of trajectory-dependent Stark and Zeeman effects on resonant coherent excitation of relativistic hydrogen-like ions channeled in a crystal Babaev, A.A.
 2010
 11-12 p. 2148-2151
4 p.
 artikel
56 Investigation of avalanche silicon detectors for low energy single ion implantation applications Yang, Changyi
 2010
 11-12 p. 2034-2037
4 p.
 artikel
57 Investigation of hydrogen concentration and hardness of ion irradiated organically modified silicate thin films Qi, Y.
 2010
 11-12 p. 1997-2000
4 p.
 artikel
58 Investigation of hydrogen depletion of organic materials upon ion beam irradiation by simultaneous micro-RBS and micro-ERDA techniques Simon, A.
 2010
 11-12 p. 2197-2201
5 p.
 artikel
59 Ion beam analysis of high pressure deposition of epitaxial PZT thin films Andrade, E.
 2010
 11-12 p. 1964-1966
3 p.
 artikel
60 Ion beam characterization of Fe-implanted GaN Gasparotto, A.
 2010
 11-12 p. 2060-2063
4 p.
 artikel
61 Ion beam micro analysis of deposits at tokamak divertor surfaces Petersson, P.
 2010
 11-12 p. 1838-1841
4 p.
 artikel
62 Ion beam mixing in uranium nitride thin films studied by Rutherford Backscattering Spectroscopy Kim-Ngan, N.-T.H.
 2010
 11-12 p. 1875-1879
5 p.
 artikel
63 Ion-scattering analysis of self-assembled monolayers of silanes on organic semiconductors Wielunski, Leszek S.
 2010
 11-12 p. 1889-1892
4 p.
 artikel
64 Limited angle STIM and PIXE tomography of single cells Andrea, T.
 2010
 11-12 p. 1884-1888
5 p.
 artikel
65 Lithium concentration dependence of implanted helium retention in lithium silicates Szőcs, D.E.
 2010
 11-12 p. 1857-1861
5 p.
 artikel
66 Mapping elemental distributions in submarine hydrothermal sulfide smokers using proton induced X-ray emission Yeats, Chris
 2010
 11-12 p. 2129-2132
4 p.
 artikel
67 MeV-energy probe SIMS imaging of major components in animal cells etched using large gas cluster ions Yamada, Hideaki
 2010
 11-12 p. 1736-1740
5 p.
 artikel
68 150MeV Nickel ion beam irradiation effects on polytetrafluoroethylene (PTFE) polymer Dhillo, Ramandeep Kaur
 2010
 11-12 p. 2189-2192
4 p.
 artikel
69 Microbeam PIXE analysis of platinum resistant and sensitive ovarian cancer cells Jeynes, J.C.G.
 2010
 11-12 p. 2168-2171
4 p.
 artikel
70 Micro-PIXE study of whole otolith of Anguilla japonica at elver stage Zheng, Y.
 2010
 11-12 p. 2152-2155
4 p.
 artikel
71 Monte Carlo simulations of ion channeling in crystals containing extended defects Turos, A.
 2010
 11-12 p. 1718-1722
5 p.
 artikel
72 Nanoscale metal-silicide films prepared by surfactant sputtering and analyzed by RBS Zhang, K.
 2010
 11-12 p. 1967-1971
5 p.
 artikel
73 New approaches for investigating paintings by ion beam techniques Beck, L.
 2010
 11-12 p. 2086-2091
6 p.
 artikel
74 Nuclear micro-beam analysis of deuterium distribution in carbon fibre composites for controlled fusion devices Petersson, P.
 2010
 11-12 p. 1833-1837
5 p.
 artikel
75 Nuclear microbeam studies of silicon–germanium heterojunction bipolar transistors (HBTs) Vizkelethy, G.
 2010
 11-12 p. 2092-2098
7 p.
 artikel
76 Nuclear microprobe investigation of the penetration of ultrafine zinc oxide into intact and tape-stripped human skin Szikszai, Z.
 2010
 11-12 p. 2160-2163
4 p.
 artikel
77 On artefacts in the secondary ion mass spectrometry profiling of high fluence H+ implants in GaAs Bailey, M.J.
 2010
 11-12 p. 2051-2055
5 p.
 artikel
78 Optimizing NRA depth profiling using Bayesian experimental design von Toussaint, U.
 2010
 11-12 p. 2115-2118
4 p.
 artikel
79 Perturbed angular correlation studies of the MAX phases Ti2AlN and Cr2GeC using ion implanted111In as probe nuclei Jürgens, Daniel
 2010
 11-12 p. 2185-2188
4 p.
 artikel
80 PIGE analysis of magnesium and beryllium Fonseca, M.
 2010
 11-12 p. 1806-1808
3 p.
 artikel
81 PIXE–PIGE analysis of some Indian medicinal plants Nomita Devi, K.
 2010
 11-12 p. 2144-2147
4 p.
 artikel
82 Polymer tribology by combining ion implantation and radionuclide tracing Timmers, Heiko
 2010
 11-12 p. 2119-2123
5 p.
 artikel
83 Positron annihilation lifetime and Doppler broadening study in 50MeV Li3+ ion irradiated polystyrene films Asad Ali, S.
 2010
 11-12 p. 1809-1812
4 p.
 artikel
84 Precise nitrogen depth profiling by high-resolution RBS in combination with angle-resolved XPS Kimura, Kenji
 2010
 11-12 p. 1960-1963
4 p.
 artikel
85 Preliminary experiments: High-energy alpha PIXE in archaeometry Dupuis, Thomas
 2010
 11-12 p. 1911-1915
5 p.
 artikel
86 Quality control of coins mint using PIXE and RBS analysis Roumie, M.
 2010
 11-12 p. 1916-1919
4 p.
 artikel
87 RBS study of diffusion under strong centrifugal force in bimetallic Au/Cu thin films Hao, T.
 2010
 11-12 p. 1867-1870
4 p.
 artikel
88 SHI induced re-crystallization of Ge implanted SiO2 films Rao, N. Srinivasa
 2010
 11-12 p. 1741-1743
3 p.
 artikel
89 Significant improvement of the osseointegration of zirconia dental implants by HS-LEIS analysis Beekmans, H.
 2010
 11-12 p. 2172-2176
5 p.
 artikel
90 Simulation of L X-ray yields induced by He ions Taborda, A.
 2010
 11-12 p. 1802-1805
4 p.
 artikel
91 Site identification of GaN using preferential scattering effect along [ 1 1 ¯ 0 0 ] axis Nishimura, T.
 2010
 11-12 p. 1942-1944
3 p.
 artikel
92 Skewness of energy-loss straggling and multiple-scattering energy distributions Mayer, M.
 2010
 11-12 p. 1744-1748
5 p.
 artikel
93 Solvent-free polymer lithography via the Kirkendall effect Thompson, Richard L.
 2010
 11-12 p. 2181-2184
4 p.
 artikel
94 Sponsorships 2010
 11-12 p. vii-
1 p.
 artikel
95 SRIM – The stopping and range of ions in matter (2010) Ziegler, James F.
 2010
 11-12 p. 1818-1823
6 p.
 artikel
96 Stopping cross-section and energy straggling of protons in SiC obtained by nuclear resonant reaction of protons with 12C and 28Si Tosaki, Mitsuo
 2010
 11-12 p. 1749-1753
5 p.
 artikel
97 Stopping force and straggling of 0.6–4.7MeV H, He and Li ions in the polyhydroxybutyrate foil Hsu, J.Y.
 2010
 11-12 p. 1786-1789
4 p.
 artikel
98 Stopping of ∼0.2–3.4MeV/amu 1H+ and 4He+ ions in polyvinyl formal Damache, S.
 2010
 11-12 p. 1759-1762
4 p.
 artikel
99 Stopping power in a cylindrical system by the modified Bessel function’s method Kitagawa, M.
 2010
 11-12 p. 1776-1780
5 p.
 artikel
100 Stopping power of 11B in Si and TiO2 measured with a bulk sample method and Bayesian inference data analysis Siketić, Z.
 2010
 11-12 p. 1768-1771
4 p.
 artikel
101 Stopping power of GaAs for swift protons: Dielectric function and optical-data model calculations Sathish, N.
 2010
 11-12 p. 1723-1726
4 p.
 artikel
102 Structural investigations in helium implanted cubic zirconia using grazing incidence XRD and EXAFS spectroscopy Kuri, G.
 2010
 11-12 p. 2177-2180
4 p.
 artikel
103 Study of Cl-containing urban aerosol particles by ion beam analytical methods Angyal, A.
 2010
 11-12 p. 2211-2215
5 p.
 artikel
104 Study of Er+ ion-implanted lithium niobate structure after an annealing procedure by RBS and RBS/channelling Mackova, A.
 2010
 11-12 p. 2042-2045
4 p.
 artikel
105 Study of modifications in Lexan polycarbonate induced by swift O6+ ion irradiation Asad Ali, S.
 2010
 11-12 p. 1813-1817
5 p.
 artikel
106 Study of xenon thermal migration in sintered titanium nitride using nuclear micro-probe Bes, R.
 2010
 11-12 p. 1880-1883
4 p.
 artikel
107 Study on time resolution of single event TOF-RBS measurement Abo, Satoshi
 2010
 11-12 p. 2019-2022
4 p.
 artikel
108 Surface analysis with high energy time-of-flight secondary ion mass spectrometry measured in parallel with PIXE and RBS Jones, Brian N.
 2010
 11-12 p. 1714-1717
4 p.
 artikel
109 The French accelerator mass spectrometry facility ASTER: Improved performance and developments Arnold, Maurice
 2010
 11-12 p. 1954-1959
6 p.
 artikel
110 The influence of stray DC magnetic fields in MeV ion nanobeam systems Merchant, M.J.
 2010
 11-12 p. 1933-1937
5 p.
 artikel
111 The Maia 384 detector array in a nuclear microprobe: A platform for high definition PIXE elemental imaging Ryan, C.G.
 2010
 11-12 p. 1899-1902
4 p.
 artikel
112 The structure of ion beam amorphised zirconolite studied by grazing angle X-ray absorption spectroscopy Reid, D.P.
 2010
 11-12 p. 1847-1852
6 p.
 artikel
113 Thin film depth profiling using simultaneous particle backscattering and nuclear resonance profiling Barradas, N.P.
 2010
 11-12 p. 1829-1832
4 p.
 artikel
114 19th International Conference on Ion Beam Analysis Webb, Roger
 2010
 11-12 p. v-
1 p.
 artikel
115 Towards calibration and characterization of high-energy beams using charged particle retrodiffusion on a double thin carbon foil system Chêne, G.
 2010
 11-12 p. 2015-2018
4 p.
 artikel
116 Trace element mapping in Parkinsonian brain by quantitative ion beam microscopy Barapatre, Nirav
 2010
 11-12 p. 2156-2159
4 p.
 artikel
117 Trace elements of soil samples from mining area Oswal, Mumtaz
 2010
 11-12 p. 2138-2140
3 p.
 artikel
118 UHV-ERDA investigation of NEG coatings Bender, M.
 2010
 11-12 p. 1986-1990
5 p.
 artikel
119 Uptake of nitric acid on NaCl single crystals measured by backscattering spectrometry Hess, Maurus
 2010
 11-12 p. 2202-2204
3 p.
 artikel
                             119 gevonden resultaten
 
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