nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A double-layer current conduction model for high-κ gate dielectric materials with interfacial oxide or silicate layer
|
Filip, V. |
|
2006 |
83 |
10 |
p. 1950-1956 7 p. |
artikel |
2 |
An efficient wet-cleaning of SiGe virtual substrates and of thick, pure Ge layers on Si(001) after a chemical mechanical planarization step
|
Abbadie, A. |
|
2006 |
83 |
10 |
p. 1986-1993 8 p. |
artikel |
3 |
Arrays of discrete atomic beams for sub-λ/2 lithography via dipole force
|
Alti, Kamlesh |
|
2006 |
83 |
10 |
p. 1975-1980 6 p. |
artikel |
4 |
Characterization of transient currents in HfO2 capacitors in the short timescale
|
Monzio Compagnoni, Christian |
|
2006 |
83 |
10 |
p. 1927-1930 4 p. |
artikel |
5 |
Compressed-carbon dioxide (CO2) assisted nanoimprint lithography using polymeric mold
|
Choi, Won Mook |
|
2006 |
83 |
10 |
p. 1957-1960 4 p. |
artikel |
6 |
Contents Continued
|
|
|
2006 |
83 |
10 |
p. 2032- 1 p. |
artikel |
7 |
Development of capillaries for wire bonding of low-k ultra-fine-pitch devices
|
Goh, K.S. |
|
2006 |
83 |
10 |
p. 2009-2014 6 p. |
artikel |
8 |
Editorial Board
|
|
|
2006 |
83 |
10 |
p. CO2- 1 p. |
artikel |
9 |
Effect of H2O evolving from TEOS based SiO2 film on the EEPROM cell characteristic
|
Lee, Junghwan |
|
2006 |
83 |
10 |
p. 2001-2003 3 p. |
artikel |
10 |
Exposure parameters for MeV proton beam writing on SU-8
|
Auzelyte, Vaida |
|
2006 |
83 |
10 |
p. 2015-2020 6 p. |
artikel |
11 |
Fabrication and characterization of Zr-rich Zr-aluminate films for high-κ gate dielectric applications
|
Li, Yuanpeng |
|
2006 |
83 |
10 |
p. 1905-1911 7 p. |
artikel |
12 |
Influence of the metal electrode on the characteristics of thermal Ta2O5 capacitors
|
Atanassova, E. |
|
2006 |
83 |
10 |
p. 1918-1926 9 p. |
artikel |
13 |
Kinetics of chemical vapor deposition of WSi x films from WF6 and SiH2Cl2: Effect of added H2, SiH4, and Si2H6
|
Saito, Takeyasu |
|
2006 |
83 |
10 |
p. 1994-2000 7 p. |
artikel |
14 |
Microstructural properties of thermally stable Ti/W/Au ohmic contacts on n-type GaN
|
Reddy, N. Ramesha |
|
2006 |
83 |
10 |
p. 1981-1985 5 p. |
artikel |
15 |
Nanomechanical analyses of porous SiO2 low-dielectric-constant films for evaluation of interconnect structure reliability
|
Chang, Shou-Yi |
|
2006 |
83 |
10 |
p. 1940-1949 10 p. |
artikel |
16 |
On the scaling issues and high-κ replacement of ultrathin gate dielectrics for nanoscale MOS transistors
|
Wong, Hei |
|
2006 |
83 |
10 |
p. 1867-1904 38 p. |
artikel |
17 |
Optically variable watermark (OVW) microstructures for transparent substrates
|
Lee, Robert A. |
|
2006 |
83 |
10 |
p. 2004-2008 5 p. |
artikel |
18 |
Printing via hot embossing of optically variable images in thermoplastic acrylic lacquer
|
Leech, Patrick W. |
|
2006 |
83 |
10 |
p. 1961-1965 5 p. |
artikel |
19 |
Scaling potential of pin-type 3-D SBT ferroelectric capacitors integrated in 0.18μm CMOS technology
|
Goux, L. |
|
2006 |
83 |
10 |
p. 2027-2031 5 p. |
artikel |
20 |
Study of X-ray lithographic conditions for SU-8 by Fourier transform infrared spectroscopy
|
Wong, D. |
|
2006 |
83 |
10 |
p. 1912-1917 6 p. |
artikel |
21 |
SU-8 nanocomposite photoresist with low stress properties for microfabrication applications
|
Jiguet, Sébastien |
|
2006 |
83 |
10 |
p. 1966-1970 5 p. |
artikel |
22 |
Template-electrodeposition preparation and structural properties of CdS nanowire arrays
|
Yang, Wenbin |
|
2006 |
83 |
10 |
p. 1971-1974 4 p. |
artikel |
23 |
The C–V–f and G/ω–V–f characteristics of Al/SiO2/p-Si (MIS) structures
|
Tataroğlu, B. |
|
2006 |
83 |
10 |
p. 2021-2026 6 p. |
artikel |
24 |
The wire sweep analysis based on the evaluation of the bending and twisting moments for semiconductor packaging
|
Kung, Huang-Kuang |
|
2006 |
83 |
10 |
p. 1931-1939 9 p. |
artikel |