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Tijdschrift beschrijving
Alle jaargangen van het bijbehorende tijdschrift
Alle afleveringen van het bijbehorende jaargang
Alle artikelen van de bijbehorende aflevering
21 gevonden resultaten
| nr | titel | auteur | tijdschrift | jaar | jaarg. | afl. | pagina('s) | type |
| 1 | Author index |
1999 |
49 | 1-2 |
p. 203-204 2 p. |
artikel |
||
| 2 | Built-in self-test |
Zorian, Yervant |
1999 |
49 | 1-2 |
p. 135-138 4 p. |
artikel |
|
| 3 | Circuit failure identification using focused ion beam and transmission electron microscopy characterisation techniques |
Pantel, R. |
1999 |
49 | 1-2 |
p. 181-189 9 p. |
artikel |
|
| 4 | Committees |
1999 |
49 | 1-2 |
p. vi- 1 p. |
artikel |
||
| 5 | Concurrent checking for VLSI |
Nicolaidis, M. |
1999 |
49 | 1-2 |
p. 139-156 18 p. |
artikel |
|
| 6 | Editorial Board |
1999 |
49 | 1-2 |
p. ii- 1 p. |
artikel |
||
| 7 | Electrical testing for failure analysis: E-beam testing |
Vallet, Michel |
1999 |
49 | 1-2 |
p. 157-167 11 p. |
artikel |
|
| 8 | Electromigration and mechanical stress |
Lloyd, J.R. |
1999 |
49 | 1-2 |
p. 51-64 14 p. |
artikel |
|
| 9 | Electrostatic discharges (ESD), latch-up and pad design constraints |
Salome, Pascal |
1999 |
49 | 1-2 |
p. 83-94 12 p. |
artikel |
|
| 10 | Emerging oxide degradation mechanisms: Stress induced leakage current (SILC) and quasi-breakdown (QB) |
Ghibaudo, G. |
1999 |
49 | 1-2 |
p. 41-50 10 p. |
artikel |
|
| 11 | Financial supports |
1999 |
49 | 1-2 |
p. vii- 1 p. |
artikel |
||
| 12 | Hot carrier degradation and time-dependent dielectric breakdown in oxides |
Groeseneken, G. |
1999 |
49 | 1-2 |
p. 27-40 14 p. |
artikel |
|
| 13 | Introduction to reliability |
Delarozée, G. |
1999 |
49 | 1-2 |
p. 3-10 8 p. |
artikel |
|
| 14 | Light emission microscopy for reliability studies |
Leroux, Charles |
1999 |
49 | 1-2 |
p. 169-180 12 p. |
artikel |
|
| 15 | Modelling and simulation of reliability for design |
Mathewson, A. |
1999 |
49 | 1-2 |
p. 95-117 23 p. |
artikel |
|
| 16 | Nanoscale reliability assessment of electronic devices |
Balk, L.J. |
1999 |
49 | 1-2 |
p. 191-202 12 p. |
artikel |
|
| 17 | Packaging reliability |
Herard, Laurent |
1999 |
49 | 1-2 |
p. 17-26 10 p. |
artikel |
|
| 18 | Plasma-induced damage |
Viswanathan, C.R. |
1999 |
49 | 1-2 |
p. 65-81 17 p. |
artikel |
|
| 19 | Preface |
Boussey, Jumana |
1999 |
49 | 1-2 |
p. 1-2 2 p. |
artikel |
|
| 20 | Qualifications strategies in IC manufacturing |
Delarozée, G. |
1999 |
49 | 1-2 |
p. 11-16 6 p. |
artikel |
|
| 21 | Test challenges in nanometric CMOS technologies |
Figueras, Joan |
1999 |
49 | 1-2 |
p. 119-133 15 p. |
artikel |
21 gevonden resultaten