| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
CMOS-compatible temperature sensor with digital output for wide temperature range applications
|
Bianchi, R.A
|
|
2000
|
31 |
9-10 |
p. 803-810
|
artikel
|
| 2 |
Computation of thermal conductivity of Si/Ge superlattices by molecular dynamics techniques
|
Volz, S.
|
|
2000
|
31 |
9-10 |
p. 815-819
|
artikel
|
| 3 |
Editorial
|
Rencz, M
|
|
2000
|
31 |
9-10 |
p. 725-726
|
artikel
|
| 4 |
Electro-thermal analysis of paralleled bipolar devices
|
D'Amore, D.
|
|
2000
|
31 |
9-10 |
p. 753-758
|
artikel
|
| 5 |
Enhancing forced convection heat transfer from multiple protruding heat sources simulating electronic components in a horizontal channel by passive cooling
|
Sultan, G.I.
|
|
2000
|
31 |
9-10 |
p. 773-779
|
artikel
|
| 6 |
Experimental detection of time dependent temperature maps in power bipolar transistors
|
Breglio, G
|
|
2000
|
31 |
9-10 |
p. 735-739
|
artikel
|
| 7 |
Improving cooling efficiency by increasing fan power usage
|
Wang, D.G
|
|
2000
|
31 |
9-10 |
p. 765-771
|
artikel
|
| 8 |
Influence of electrothermal interactions on nonisothermal small-signal parameters of BJTs in ICs
|
Stepowicz, W.J.
|
|
2000
|
31 |
9-10 |
p. 759-764
|
artikel
|
| 9 |
Modeling of thermal actuation in a bulk-micromachined CMOS micromirror
|
Liew, L.-A
|
|
2000
|
31 |
9-10 |
p. 791-801
|
artikel
|
| 10 |
Modelling electronic circuit radiation cooling using analytical thermal model
|
Janicki, M
|
|
2000
|
31 |
9-10 |
p. 781-785
|
artikel
|
| 11 |
New approaches in the transient thermal measurements
|
Székely, V
|
|
2000
|
31 |
9-10 |
p. 727-733
|
artikel
|
| 12 |
Photoacoustic investigations of beryllium containing wide gap II–VI mixed crystals
|
Zakrzewski, J.
|
|
2000
|
31 |
9-10 |
p. 821-824
|
artikel
|
| 13 |
Realization of an electronically controlled thermal resistance
|
Székely, V
|
|
2000
|
31 |
9-10 |
p. 811-814
|
artikel
|
| 14 |
Simulation of micro-channel heat sinks for optoelectronic microsystems
|
Kreutz, E.W
|
|
2000
|
31 |
9-10 |
p. 787-790
|
artikel
|
| 15 |
Thermal characterization of LDMOS transistors for accelerating stress testing
|
Bosc, J.M
|
|
2000
|
31 |
9-10 |
p. 747-752
|
artikel
|
| 16 |
Thermal mapping and 3D numerical simulation of new cellular power MOS affected by electro-thermal instability
|
Breglio, G
|
|
2000
|
31 |
9-10 |
p. 741-746
|
artikel
|
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