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                             29 results found
no title author magazine year volume issue page(s) type
1 Amorphous BN films produced in a double-plasma reactor for semiconductor applications 1986
 17 5 p. 41-
1 p.
 article
2 A normalized analytical solution for the capacitance associated with uniformly doped semiconductors at equilibrium 1986
 17 5 p. 43-
1 p.
 article
3 Apology 1986
 17 5 p. 48-
1 p.
 article
4 Carrier lifetime in (Al,Ga)As epilayers and double heterostructure lasers grown with metal-organic vapour-phase epitaxy and liquid-phase epitaxy 1986
 17 5 p. 44-
1 p.
 article
5 CHMOS improves system efficiency 1986
 17 5 p. 41-
1 p.
 article
6 Diffusivity and growth rate of silicon in solid-phase epitaxy with an aluminium medium 1986
 17 5 p. 42-
1 p.
 article
7 E-beam system metrology 1986
 17 5 p. 43-
1 p.
 article
8 Economics of multiple site testing of PCBs 1986
 17 5 p. 43-
1 p.
 article
9 Editorial Butcher, John
 1986
 17 5 p. 3-
1 p.
 article
10 Facing the headaches of early failures: a state-of-the-art review of burn-in decisions 1986
 17 5 p. 42-
1 p.
 article
11 General purpose intelligent sensors Haskard, Malcolm R.
 1986
 17 5 p. 9-14
6 p.
 article
12 Inversion electron mobility in Si−SiO2 structures oxidized at low and high temperatures Kassabov, J.
 1986
 17 5 p. 15-22
8 p.
 article
13 Joint ventures 1986
 17 5 p. 40-
1 p.
 article
14 Lifetime and drift velocity for electromigration in sputtered Al films, multilayers and alloys 1986
 17 5 p. 41-
1 p.
 article
15 Low temperature processed MOSFET's using laser recrystalized polycrystalline silicon films 1986
 17 5 p. 42-
1 p.
 article
16 Microelectronic ball-bond shear test—a critical review and comprehensive guide to its users 1986
 17 5 p. 43-
1 p.
 article
17 Modelling DC characteristics of heterostructure bipolar junction transistors Abuelma'atti, Muhammad Taher
 1986
 17 5 p. 5-8
4 p.
 article
18 [No title] Howson, M.
 1986
 17 5 p. 33-
1 p.
 article
19 Printed board assembly cleanliness—standards, practice and reliability considerations 1986
 17 5 p. 41-
1 p.
 article
20 Quality assurance system and reliability testing of LSI circuits 1986
 17 5 p. 43-
1 p.
 article
21 Research and Development 1986
 17 5 p. 35-36
2 p.
 article
22 Semiconductor surfaces and interfaces 1986
 17 5 p. 44-
1 p.
 article
23 Technique for measuring the moisture content of sealed IC packages 1986
 17 5 p. 43-
1 p.
 article
24 Temperature dependence of carrier transport in polycrystalline silicon Lee, J.Y.
 1986
 17 5 p. 23-32
10 p.
 article
25 The Eureka joint projects list 1986
 17 5 p. 37-39
3 p.
 article
26 The influence of corrosion inhibitor and surface abrasion on the failure of aluminium-wired twist-on connections 1986
 17 5 p. 43-
1 p.
 article
27 The measurement and sources of substrate heat flux encountered with magnetron sputtering 1986
 17 5 p. 42-
1 p.
 article
28 Thermal management of electronic packages 1986
 17 5 p. 42-
1 p.
 article
29 Trends in packaging and interconnection of integrated circuits 1986
 17 5 p. 42-
1 p.
 article
                             29 results found
 
 Koninklijke Bibliotheek - National Library of the Netherlands