| no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
| 1 |
A new meshing criterion for the equivalent thermal analysis of GaAs PHEMT MMICs
|
Xu, Xiuqin
|
|
2017
|
68 |
C |
p. 30-38
9 p.
|
article
|
| 2 |
Commercial-off-the-shelf algan/gan hemt device reliability study after exposure to heavy ion radiation
|
Poling, B.S.
|
|
2017
|
68 |
C |
p. 13-20
8 p.
|
article
|
| 3 |
Determination of safe reliability region over temperature and current density for through wafer vias
|
Whitman, Charles S.
|
|
2017
|
68 |
C |
p. 5-12
8 p.
|
article
|
| 4 |
DIRT latch: A novel low cost double node upset tolerant latch
|
Eftaxiopoulos, Nikolaos
|
|
2017
|
68 |
C |
p. 57-68
12 p.
|
article
|
| 5 |
Durability evaluation of hexagonal WO3 electrode for lithium ion secondary batteries
|
Sasaki, Akito
|
|
2017
|
68 |
C |
p. 86-90
5 p.
|
article
|
| 6 |
Editorial
|
Ersland, Peter
|
|
2017
|
68 |
C |
p. 1-
1 p.
|
article
|
| 7 |
Editorial Board
|
|
|
2017
|
68 |
C |
p. IFC-
1 p.
|
article
|
| 8 |
Evaluation of the impact of the physical dimensions and material of the semiconductor chip on the reliability of Sn3.5Ag solder interconnect in power electronic module: A finite element analysis perspective
|
Rajaguru, P.
|
|
2017
|
68 |
C |
p. 77-85
9 p.
|
article
|
| 9 |
Heat transfer enhancement of LEDs with a combination of piezoelectric fans and a heat sink
|
Sufian, S.F.
|
|
2017
|
68 |
C |
p. 39-50
12 p.
|
article
|
| 10 |
Investigation of read disturb in split-gate memory and its feasible solution
|
Zhu, Wenyi
|
|
2017
|
68 |
C |
p. 51-56
6 p.
|
article
|
| 11 |
Microstructure and mechanical properties of Co/Sn-10Bi couple and Co/Sn-10Bi/Co joint
|
Lai, Zhongmin
|
|
2017
|
68 |
C |
p. 69-76
8 p.
|
article
|
| 12 |
Morphological and electrical comparison of Ti and Ta based ohmic contacts for AlGaN/GaN-on-SiC HFETs
|
Pooth, A.
|
|
2017
|
68 |
C |
p. 2-4
3 p.
|
article
|
| 13 |
Reliability prediction with MTOL
|
Bernstein, Joseph B.
|
|
2017
|
68 |
C |
p. 91-97
7 p.
|
article
|
| 14 |
Total Ionizing Dose, Random Dopant Fluctuations, and its combined effect in the 45nm PDSOI node
|
Chatzikyriakou, Eleni
|
|
2017
|
68 |
C |
p. 21-29
9 p.
|
article
|
Journal description