Digitale Bibliotheek
Sluiten Bladeren door artikelen uit een tijdschrift
     Tijdschrift beschrijving
       Alle jaargangen van het bijbehorende tijdschrift
         Alle afleveringen van het bijbehorende jaargang
                                       Alle artikelen van de bijbehorende aflevering
 
                             20 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A high level synthesis design flow with a novel approach for efficient design space exploration in case of multi-parametric optimization objective Sengupta, Anirban
2010
50 3 p. 424-437
14 p.
artikel
2 Analysis of dependence of short-channel effects in double-gate MOSFETs on channel thickness Kobayashi, Yusuke
2010
50 3 p. 332-337
6 p.
artikel
3 A prognostics and health management roadmap for information and electronics-rich systems Pecht, Michael
2010
50 3 p. 317-323
7 p.
artikel
4 Calendar 2010
50 3 p. I-III
nvt p.
artikel
5 Circuit level interconnect reliability study using 3D circuit model He, Feifei
2010
50 3 p. 376-390
15 p.
artikel
6 Electromigration-induced stress in a confined bamboo interconnect with randomly distributed grain sizes Dong, X.
2010
50 3 p. 391-397
7 p.
artikel
7 Electro-thermal stress effect on InGaP/GaAs heterojunction bipolar low-noise amplifier performance Liu, Xiang
2010
50 3 p. 365-369
5 p.
artikel
8 Extraction of VBIC model parameters for InGaAsSb DHBTs Chang, Yang-Hua
2010
50 3 p. 370-375
6 p.
artikel
9 Impact of interface state trap density on the performance characteristics of different III–V MOSFET architectures Benbakhti, B.
2010
50 3 p. 360-364
5 p.
artikel
10 Improved resolution method to study at 3D the conduction phenomena inside GaAs PIN photodiode Bouabdallah, B.
2010
50 3 p. 447-453
7 p.
artikel
11 Inside front cover - Editorial board 2010
50 3 p. IFC-
1 p.
artikel
12 Modeling of drain current, capacitance and transconductance in thin film undoped symmetric DG MOSFETs including quantum effects Mohammadi, Saeed
2010
50 3 p. 338-345
8 p.
artikel
13 Observation of halo implant from the drain side reaching the source side and vice versa in extremely short p-channel transistors Lau, W.S.
2010
50 3 p. 346-350
5 p.
artikel
14 Reliability enhancement of digital combinational circuits based on evolutionary approach Seyyed Mahdavi, S.J.
2010
50 3 p. 415-423
9 p.
artikel
15 Reliability growth modeling for in-service electronic systems considering latent failure modes Jin, Tongdan
2010
50 3 p. 324-331
8 p.
artikel
16 Reliability Object Model Tree (ROM-Tree): A system design-for-reliability method Kim, Injoong
2010
50 3 p. 438-446
9 p.
artikel
17 SrO capping effect for La2O3/Ce-silicate gate dielectrics Kakushima, K.
2010
50 3 p. 356-359
4 p.
artikel
18 The frequency-dependent electrical characteristics of interfaces in the Sn/p-Si metal semiconductor structures Karataş, Ş.
2010
50 3 p. 351-355
5 p.
artikel
19 The use of Mahalanobis–Taguchi System to improve flip-chip bumping height inspection efficiency Yang, Taho
2010
50 3 p. 407-414
8 p.
artikel
20 Warpage mechanism analyses of strip panel type PBGA chip packaging Kim, Yeong K.
2010
50 3 p. 398-406
9 p.
artikel
                             20 gevonden resultaten
 
 Koninklijke Bibliotheek - Nationale Bibliotheek van Nederland