no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
1 |
Accuracy of approx confidence bounds using censored Weibull regression data from accelerated life tests
|
|
|
1991 |
31 |
1 |
p. 203- 1 p. |
article |
2 |
A cluster-modified Poisson model for estimating defect density and yield
|
|
|
1991 |
31 |
1 |
p. 209- 1 p. |
article |
3 |
Adapting mechanical models to fit electronics
|
|
|
1991 |
31 |
1 |
p. 199- 1 p. |
article |
4 |
A general theory of software-reliability modeling
|
|
|
1991 |
31 |
1 |
p. 205- 1 p. |
article |
5 |
Analysis of printed wiring board assembly system
|
|
|
1991 |
31 |
1 |
p. 208- 1 p. |
article |
6 |
Analysis of temperature dependence of CMOS transistors' threshold voltage
|
Prijić, Z.D. |
|
1991 |
31 |
1 |
p. 33-37 5 p. |
article |
7 |
An analytic approach to performing a maintainability demonstration
|
|
|
1991 |
31 |
1 |
p. 206- 1 p. |
article |
8 |
An automated methodology for generating a fault tree
|
|
|
1991 |
31 |
1 |
p. 207- 1 p. |
article |
9 |
A newly developed model for stress induced slit-like voiding
|
|
|
1991 |
31 |
1 |
p. 200- 1 p. |
article |
10 |
A new method to calculate the failure frequency of noncoherent systems
|
|
|
1991 |
31 |
1 |
p. 203- 1 p. |
article |
11 |
A new technique for imaging the logic state of passivated conductors: biased resistive contrast imaging
|
|
|
1991 |
31 |
1 |
p. 200- 1 p. |
article |
12 |
An improved minimizing algorithm for sum of disjoint products
|
|
|
1991 |
31 |
1 |
p. 204- 1 p. |
article |
13 |
An investigation of corrosion on integrated circuits via pressure-temperature-humidity-bias stressing
|
|
|
1991 |
31 |
1 |
p. 200- 1 p. |
article |
14 |
A non-homogeneous Markov model for phased-mission reliability analysis
|
|
|
1991 |
31 |
1 |
p. 204- 1 p. |
article |
15 |
A nonparametric-Bayes reliability-growth model
|
|
|
1991 |
31 |
1 |
p. 205- 1 p. |
article |
16 |
A note on a multi-unit system with r repair facility
|
Sridharan, V. |
|
1991 |
31 |
1 |
p. 85-89 5 p. |
article |
17 |
A note on computing environments and network reliability
|
Page, Lavon B. |
|
1991 |
31 |
1 |
p. 185-186 2 p. |
article |
18 |
4907230 Apparatus and method for testing printed circuit boards and their components
|
Heller, Rik |
|
1991 |
31 |
1 |
p. vii- 1 p. |
article |
19 |
Are electromigration failures lognormally distributed?
|
|
|
1991 |
31 |
1 |
p. 202- 1 p. |
article |
20 |
A simple approximation to the renewal function
|
|
|
1991 |
31 |
1 |
p. 205- 1 p. |
article |
21 |
A simple fault-diagnosis system with periodic testing
|
|
|
1991 |
31 |
1 |
p. 205- 1 p. |
article |
22 |
A time-dependent availability measure for a reparable system subject to catastrophic failures
|
|
|
1991 |
31 |
1 |
p. 206- 1 p. |
article |
23 |
4902969 Automated burn-in system
|
Gussman, RobertL |
|
1991 |
31 |
1 |
p. v- 1 p. |
article |
24 |
Barriers to total quality management in the Department of Defense
|
|
|
1991 |
31 |
1 |
p. 199- 1 p. |
article |
25 |
Bayes comparison of 2 lognormal reliability functions
|
|
|
1991 |
31 |
1 |
p. 202- 1 p. |
article |
26 |
Bayesian estimation of reliability function and hazard rate
|
Siddiqui, S.A. |
|
1991 |
31 |
1 |
p. 53-57 5 p. |
article |
27 |
Behavioural analysis of a paper production system with different repair policies
|
Kumar, Dinesh |
|
1991 |
31 |
1 |
p. 47-51 5 p. |
article |
28 |
Brazing to low-temperature-fired thick films
|
|
|
1991 |
31 |
1 |
p. 210- 1 p. |
article |
29 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1991 |
31 |
1 |
p. 193-195 3 p. |
article |
30 |
Classical and Bayes approaches to environmental stress screening (ESS): a comparison
|
|
|
1991 |
31 |
1 |
p. 206- 1 p. |
article |
31 |
Computing 2-terminal reliability for radio-broadcast networks
|
|
|
1991 |
31 |
1 |
p. 203-204 2 p. |
article |
32 |
Control of defects in the heteroepitaxial growth of GaAs on silicon
|
|
|
1991 |
31 |
1 |
p. 210- 1 p. |
article |
33 |
Current transport mechanism of polysilicon-emitter transistor
|
Srivastava, A. |
|
1991 |
31 |
1 |
p. 27-31 5 p. |
article |
34 |
D.C. performance of short-channel ion-implanted GaAs MESFETs (the role of gate length shortening)
|
|
|
1991 |
31 |
1 |
p. 211- 1 p. |
article |
35 |
Decision rule for an exponential reliability function
|
Jòz̀wiak, Ireneusz J. |
|
1991 |
31 |
1 |
p. 71-73 3 p. |
article |
36 |
Depth profiling techniques for the elemental analysis of semiconductor layers
|
|
|
1991 |
31 |
1 |
p. 210- 1 p. |
article |
37 |
Design for manufacturability and yield
|
|
|
1991 |
31 |
1 |
p. 209- 1 p. |
article |
38 |
Determining optimal redundancy for systems with random lifetimes
|
|
|
1991 |
31 |
1 |
p. 204- 1 p. |
article |
39 |
Developing a decision support system for optimizing automated wafer fabrication
|
|
|
1991 |
31 |
1 |
p. 207-208 2 p. |
article |
40 |
4889242 Device for testing and sorting electronic components, more particularly integrated circuit chips
|
Willberg, HansH |
|
1991 |
31 |
1 |
p. i-ii nvt p. |
article |
41 |
Diagnostic-strategy selection for series systems
|
|
|
1991 |
31 |
1 |
p. 205-206 2 p. |
article |
42 |
Direct chip interconnect using polymer bonding
|
|
|
1991 |
31 |
1 |
p. 208- 1 p. |
article |
43 |
4899107 Discrete die burn-in for nonpackaged die
|
Corbett, TimJ |
|
1991 |
31 |
1 |
p. v- 1 p. |
article |
44 |
Distribution of time to failure of consecutive k-out-of-n: F systems
|
|
|
1991 |
31 |
1 |
p. 204- 1 p. |
article |
45 |
Editorial Board
|
|
|
1991 |
31 |
1 |
p. IFC- 1 p. |
article |
46 |
Effect of mold compound components on moisture-induced degradation of gold-aluminum bonds in epoxy encapsulated devices
|
|
|
1991 |
31 |
1 |
p. 202- 1 p. |
article |
47 |
Effect of nitrogen ion bombardment at copper-alumina interface
|
|
|
1991 |
31 |
1 |
p. 211- 1 p. |
article |
48 |
Effects of dust on various lubricated sliding contacts
|
|
|
1991 |
31 |
1 |
p. 200- 1 p. |
article |
49 |
EPAS: an emitter piloting advisory expert system for IC emitter deposition
|
|
|
1991 |
31 |
1 |
p. 209- 1 p. |
article |
50 |
Error analysis for optimal design of accelerated tests
|
|
|
1991 |
31 |
1 |
p. 206- 1 p. |
article |
51 |
Estimation and predictive density for the generalized logistic distribution
|
Ragab, Aisha |
|
1991 |
31 |
1 |
p. 91-95 5 p. |
article |
52 |
Estimation of reliability in multi-component stress-strength model following a Burr distribution
|
Pandey, M. |
|
1991 |
31 |
1 |
p. 21-25 5 p. |
article |
53 |
Estimation of scale parameters for two exponential distributions
|
|
|
1991 |
31 |
1 |
p. 203- 1 p. |
article |
54 |
Estimation of thin-oxide reliablity using proportional hazards models
|
|
|
1991 |
31 |
1 |
p. 210- 1 p. |
article |
55 |
Etch diagnostics for new III–V and other semiconductors
|
|
|
1991 |
31 |
1 |
p. 208- 1 p. |
article |
56 |
Evaluating the reliability of reparable systems
|
|
|
1991 |
31 |
1 |
p. 207- 1 p. |
article |
57 |
Evaluation of optimal-reliability indices for electrical distribution systems
|
|
|
1991 |
31 |
1 |
p. 203- 1 p. |
article |
58 |
Evaluation of polyimides as dielectric materials for multichip packages with multilevel interconnection structure
|
|
|
1991 |
31 |
1 |
p. 209- 1 p. |
article |
59 |
Evolution of VLSI reliability engineering
|
|
|
1991 |
31 |
1 |
p. 207- 1 p. |
article |
60 |
Expert systems maintainability
|
|
|
1991 |
31 |
1 |
p. 206- 1 p. |
article |
61 |
Fault-simulation programs for integrated-circuit yield estimations
|
|
|
1991 |
31 |
1 |
p. 209- 1 p. |
article |
62 |
Fault-tolerant hypercube multiprocessors
|
|
|
1991 |
31 |
1 |
p. 203- 1 p. |
article |
63 |
Fault-tolerant microprocessor-based overcurrent relays
|
Manzoul, Mahmoud A. |
|
1991 |
31 |
1 |
p. 133-139 7 p. |
article |
64 |
Formulation of the drift reliability optimization problem
|
Styblinski, M.A. |
|
1991 |
31 |
1 |
p. 159-171 13 p. |
article |
65 |
Fuzzy weighted-checklist with linguistic variables
|
|
|
1991 |
31 |
1 |
p. 207- 1 p. |
article |
66 |
Gallium arsenide finds a new niche
|
|
|
1991 |
31 |
1 |
p. 207- 1 p. |
article |
67 |
Generalized availability measures for reparable systems with preparation time for repair
|
Butani, N.L. |
|
1991 |
31 |
1 |
p. 43-46 4 p. |
article |
68 |
Hot-carrier reliability of bipolar transistors
|
|
|
1991 |
31 |
1 |
p. 201- 1 p. |
article |
69 |
Human dependability requirements, scope and implementation at the European Space Agency
|
|
|
1991 |
31 |
1 |
p. 199- 1 p. |
article |
70 |
4891586 IC grabber probe
|
Leber, David |
|
1991 |
31 |
1 |
p. ii-iii nvt p. |
article |
71 |
Importance and sensitivity analysis in assessing system reliability
|
|
|
1991 |
31 |
1 |
p. 206- 1 p. |
article |
72 |
4907065 Integrated circuit chip sealing assembly
|
Sahakian, VahakK |
|
1991 |
31 |
1 |
p. vii- 1 p. |
article |
73 |
4903111 Integrated circuit device
|
Takemae, Yoshihir |
|
1991 |
31 |
1 |
p. v- 1 p. |
article |
74 |
Integrating CAM and process simulation to enhance online analysis and control of IC fabrication
|
|
|
1991 |
31 |
1 |
p. 208- 1 p. |
article |
75 |
Internal friction: a fast technique for electromigration failure analysis
|
|
|
1991 |
31 |
1 |
p. 201- 1 p. |
article |
76 |
Ion-assisted processing of GaAs for optical devices
|
|
|
1991 |
31 |
1 |
p. 211- 1 p. |
article |
77 |
Local characterization of ultrathin oxides on silicon wafers by scanning tunneling microscopy
|
|
|
1991 |
31 |
1 |
p. 210- 1 p. |
article |
78 |
Long-haul undersea communications systems: hardware redundancy techniques for ultra-reliability
|
|
|
1991 |
31 |
1 |
p. 207- 1 p. |
article |
79 |
4894708 LSI package having a multilayer ceramic substrate
|
Watari, Toshihik |
|
1991 |
31 |
1 |
p. iv- 1 p. |
article |
80 |
Markov model for k-out-of-n:G systems with built-in-test
|
Shao, Jiajun |
|
1991 |
31 |
1 |
p. 123-131 9 p. |
article |
81 |
4906326 Mask repair system
|
Amemiya, Mitsuak |
|
1991 |
31 |
1 |
p. vi- 1 p. |
article |
82 |
Measurement of three dimensional stress and modeling of stress induced migration failure in aluminum interconnects
|
|
|
1991 |
31 |
1 |
p. 201- 1 p. |
article |
83 |
4894605 Method and on-chip apparatus for continuity testing
|
Ringleb, Diethelm |
|
1991 |
31 |
1 |
p. iii-iv nvt p. |
article |
84 |
4903267 Method of generating test data
|
Arai, Kiyokazu |
|
1991 |
31 |
1 |
p. vi- 1 p. |
article |
85 |
4903199 Method of increasing the speed of test program execution for testing electrical characteristics of integrated circuits
|
Russ Keenan, W |
|
1991 |
31 |
1 |
p. v-vi nvt p. |
article |
86 |
4902632 Method of preventing superficial electrical discharges in chips of semiconductor devices during testing
|
Oliveri, Carmel |
|
1991 |
31 |
1 |
p. v- 1 p. |
article |
87 |
Microelectronics reliability predictions derived from component defect densities
|
|
|
1991 |
31 |
1 |
p. 201- 1 p. |
article |
88 |
Microprocessor interfacing
|
G.W.A.D., |
|
1991 |
31 |
1 |
p. 191- 1 p. |
article |
89 |
Microvoids and defect chemistry at the Si-SiO2 interface studied by positron annihilation depth profiling
|
|
|
1991 |
31 |
1 |
p. 210- 1 p. |
article |
90 |
4891585 Multiple lead probe for integrated circuits in wafer form
|
Janko, Bozidar |
|
1991 |
31 |
1 |
p. ii- 1 p. |
article |
91 |
Neural network realization of Markov reliability and fault-tolerance models
|
Suliman, Mamoun |
|
1991 |
31 |
1 |
p. 141-147 7 p. |
article |
92 |
New directions in electrical testing of PCBs for the 1990s
|
|
|
1991 |
31 |
1 |
p. 200- 1 p. |
article |
93 |
Nonparametric Bayes estimation of the survival function and failure rate from record-breaking data
|
Tiwari, Ram C. |
|
1991 |
31 |
1 |
p. 149-157 9 p. |
article |
94 |
On measures of importance for components in multistate coherent systems
|
Abouammoh, A.M. |
|
1991 |
31 |
1 |
p. 109-122 14 p. |
article |
95 |
On the utilization analysis of a two-stage transfer line production system subject to inter-stage inspection and initial buffer
|
Gopalan, M.N. |
|
1991 |
31 |
1 |
p. 59-64 6 p. |
article |
96 |
Optimal low-frequency noise criteria used as a reliability test for BJTs and experimental results
|
Dai, Yisong |
|
1991 |
31 |
1 |
p. 75-78 4 p. |
article |
97 |
Optimal testing-policies for intermittent faults
|
|
|
1991 |
31 |
1 |
p. 203- 1 p. |
article |
98 |
Optimization limits in improving system reliability
|
|
|
1991 |
31 |
1 |
p. 204- 1 p. |
article |
99 |
Optimum release policy for an inflection s-shaped software reliability growth model
|
Kapur, P.K. |
|
1991 |
31 |
1 |
p. 39-41 3 p. |
article |
100 |
Parameter compatibility relations for accelerated testing
|
|
|
1991 |
31 |
1 |
p. 204-205 2 p. |
article |
101 |
Partial factoring: an efficient algorithm for approximating 2-terminal reliability on complete graphs
|
|
|
1991 |
31 |
1 |
p. 204- 1 p. |
article |
102 |
Particles on surfaces 2 detection, adhesion, and removal
|
G.W.A.D., |
|
1991 |
31 |
1 |
p. 190-191 2 p. |
article |
103 |
Performability of the hypercube
|
|
|
1991 |
31 |
1 |
p. 203- 1 p. |
article |
104 |
Pi-factors revisited
|
|
|
1991 |
31 |
1 |
p. 206- 1 p. |
article |
105 |
PLISD: a new high-vacuum sputtering technique for thin film deposition
|
|
|
1991 |
31 |
1 |
p. 210- 1 p. |
article |
106 |
Prediction limits for an exponential distribution: a Bayes predictive distribution approach
|
|
|
1991 |
31 |
1 |
p. 205- 1 p. |
article |
107 |
4894114 Process for producing VIAS in semiconductor
|
Nathanson, HarveyC |
|
1991 |
31 |
1 |
p. iii- 1 p. |
article |
108 |
Profit analysis of a two multi-component unit standby system with MRT
|
Gupta, Rakesh |
|
1991 |
31 |
1 |
p. 7-10 4 p. |
article |
109 |
Profit analysis of a two-unit cold standby system with abnormal weather condition
|
Gupta, Rakesh |
|
1991 |
31 |
1 |
p. 1-5 5 p. |
article |
110 |
Properties of the MLE for parameters of a Weibull regression model under Type I censoring
|
|
|
1991 |
31 |
1 |
p. 203- 1 p. |
article |
111 |
Publications, notices, calls for papers, etc.
|
|
|
1991 |
31 |
1 |
p. 197-198 2 p. |
article |
112 |
Qualifying of chip bonding operations in the process of fabrication of bipolar transistors by means of noise measurements in the low-frequency range
|
|
|
1991 |
31 |
1 |
p. 208- 1 p. |
article |
113 |
Rapid formation of ultra-thin dielectrics by Si surface modification using a large area low energy electron beam
|
|
|
1991 |
31 |
1 |
p. 211- 1 p. |
article |
114 |
Reliability analysis in the presence of chance common cause shock failures
|
Chari, A.A. |
|
1991 |
31 |
1 |
p. 15-19 5 p. |
article |
115 |
Reliability assurance of application-specific microelectronic circuits
|
|
|
1991 |
31 |
1 |
p. 205- 1 p. |
article |
116 |
Reliability improvement of power inverters through environmental stress simulation
|
|
|
1991 |
31 |
1 |
p. 201- 1 p. |
article |
117 |
Reliability of directed networks using the factoring theorem
|
|
|
1991 |
31 |
1 |
p. 205- 1 p. |
article |
118 |
Reliability of hot water solar systems in Greece
|
|
|
1991 |
31 |
1 |
p. 204- 1 p. |
article |
119 |
Reliability of optoelectronic devices for fiber optic communications
|
|
|
1991 |
31 |
1 |
p. 201- 1 p. |
article |
120 |
Reliability study on polycrystalline silicon thin film resistors used in LSIs under thermal and electrical stress
|
|
|
1991 |
31 |
1 |
p. 211- 1 p. |
article |
121 |
Replacement policies for a cumulative damage model with minimal repair at failure
|
|
|
1991 |
31 |
1 |
p. 205- 1 p. |
article |
122 |
4891684 Semiconductor device
|
Nishioka, Yasushiro |
|
1991 |
31 |
1 |
p. iii- 1 p. |
article |
123 |
4881029 Semiconductor integrated circuit devices and methods for testing same
|
Kawamura, Masahiko |
|
1991 |
31 |
1 |
p. i- 1 p. |
article |
124 |
4890148 Semiconductor memory cell device with thick insulative layer
|
Ikeda, Shuji |
|
1991 |
31 |
1 |
p. ii- 1 p. |
article |
125 |
4897817 Semiconductor memory device with a built-in test circuit
|
Katanosaka, Naoki |
|
1991 |
31 |
1 |
p. iv- 1 p. |
article |
126 |
Silicon-on-insulator: materials aspects and technological applications
|
|
|
1991 |
31 |
1 |
p. 208- 1 p. |
article |
127 |
Simulation at the register transfer level as a method of investigation of VLSI integrated circuits
|
|
|
1991 |
31 |
1 |
p. 201- 1 p. |
article |
128 |
Simulation of transients in VLSI packaging interconnections
|
|
|
1991 |
31 |
1 |
p. 209- 1 p. |
article |
129 |
Smooth nonparametric estimation of mean residual life
|
Kulasekera, K.B. |
|
1991 |
31 |
1 |
p. 97-108 12 p. |
article |
130 |
Society of reliability engineers bulletin
|
Reiche, Hans |
|
1991 |
31 |
1 |
p. 187- 1 p. |
article |
131 |
Software-reliability evaluation of the TROPICO-R switching system
|
|
|
1991 |
31 |
1 |
p. 202- 1 p. |
article |
132 |
Stochastic behaviour of a two-unit system with two types of repairman and subject to random inspection
|
Tuteja, R.K. |
|
1991 |
31 |
1 |
p. 79-83 5 p. |
article |
133 |
Stochastic models for mission effectiveness
|
|
|
1991 |
31 |
1 |
p. 202- 1 p. |
article |
134 |
Stress screening of electronic modules: investigation of effects of temperature rate of change
|
|
|
1991 |
31 |
1 |
p. 202- 1 p. |
article |
135 |
4906921 Structure and process for testing integrated circuits permitting determination of the properties of layers
|
Juge, Andre |
|
1991 |
31 |
1 |
p. vii- 1 p. |
article |
136 |
Temperature-cycling acceleration factors for aluminum metallization failure in VLSI applications
|
|
|
1991 |
31 |
1 |
p. 202- 1 p. |
article |
137 |
4881229 Test circuit arrangement for a communication network and test method using same
|
Kaltbeitzel, Gunter |
|
1991 |
31 |
1 |
p. i- 1 p. |
article |
138 |
4896108 Test circuit for measuring specific contact resistivity of self-aligned contacts in integrated circuits
|
Lynch, WilliamT |
|
1991 |
31 |
1 |
p. iv- 1 p. |
article |
139 |
4904934 Testing apparatus for semiconductor devices
|
Nishihashi, Ryouj |
|
1991 |
31 |
1 |
p. vi- 1 p. |
article |
140 |
Test of amorphous silicon solar cells: Characteristics degradation due to exposure to intermittent light at several constant ambient temperatures and the validity of the test method
|
Yanagisawa, T. |
|
1991 |
31 |
1 |
p. 173-184 12 p. |
article |
141 |
The effects of defects on the early failure of metal interconnects
|
|
|
1991 |
31 |
1 |
p. 200- 1 p. |
article |
142 |
The effects of sample distance on Al-film structure when using magnetron sputtering ion-plating
|
|
|
1991 |
31 |
1 |
p. 211- 1 p. |
article |
143 |
The electrical resistance ratio (RR) as a thin film metal monitor
|
|
|
1991 |
31 |
1 |
p. 210- 1 p. |
article |
144 |
The harmfulness of blowholes in PTH soldered assemblies
|
|
|
1991 |
31 |
1 |
p. 201- 1 p. |
article |
145 |
The influence of fault occurrence on multiaccess system throughput
|
Jòz̀wiak, Ireneusz J. |
|
1991 |
31 |
1 |
p. 65-69 5 p. |
article |
146 |
The NASA trend analysis program
|
|
|
1991 |
31 |
1 |
p. 199- 1 p. |
article |
147 |
Thermal breakdown of VLSI by ESD pulses
|
|
|
1991 |
31 |
1 |
p. 201-202 2 p. |
article |
148 |
Thermal stress analysis of tape automated bonding packages and interconnections
|
|
|
1991 |
31 |
1 |
p. 208- 1 p. |
article |
149 |
The use and evaluation of yield models in integrated circuit manufacturing
|
|
|
1991 |
31 |
1 |
p. 209- 1 p. |
article |
150 |
4899055 Thin film thickness measuring method
|
Adams, Arnol |
|
1991 |
31 |
1 |
p. iv-v nvt p. |
article |
151 |
Timing analysis forestalls failures in digital circuits
|
|
|
1991 |
31 |
1 |
p. 207- 1 p. |
article |
152 |
Two-unit redundant system with inspection and adjustable rates
|
Goel, L.R. |
|
1991 |
31 |
1 |
p. 11-14 4 p. |
article |
153 |
Use of advanced analytical techniques for VLSI failure analysis
|
|
|
1991 |
31 |
1 |
p. 206- 1 p. |
article |
154 |
Using test data to predict avionics integrity
|
|
|
1991 |
31 |
1 |
p. 206- 1 p. |
article |
155 |
Very thin oxides in VLSI technology: properties and device implications
|
|
|
1991 |
31 |
1 |
p. 209- 1 p. |
article |
156 |
Visual inspection of surface-mounted solder joints
|
|
|
1991 |
31 |
1 |
p. 200-201 2 p. |
article |
157 |
VLSI reliability
|
G.W.A.D., |
|
1991 |
31 |
1 |
p. 189-190 2 p. |
article |