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Details for article 7 of 219 found articles
| Title: |
An Alternative X-ray Diffraction Analysis for Comprehensive Determination of Structural Properties in Compositionally Graded Strained AlGaN Epilayers |
| Author: |
Das, Palash Jana, Sanjay Kumar Halder, Nripendra N. Mallik, S. Mahato, S. S. Panda, A. K. Chow, Peter P. Biswas, Dhrubes |
| Appeared in: |
Electronic materials letters |
| Paging: | Volume 14 (2018) nr. 6 pages 784-792 |
| Year: |
2018 |
| Contents: | |
| Publisher: |
The Korean Institute of Metals and Materials, Seoul |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 7 of 219 found articles
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