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Journal description
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Details for article 7 of 8 found articles
| Title: |
Precision measurement and nondestructive testing by means of digital phase shifting speckle pattern and speckle pattern shearing interferometry |
| Author: |
Yang, L.X. Steinchen, W. Schuth, M. Kupfer, G. |
| Appeared in: |
Measurement |
| Paging: | Volume 16 (1995) nr. 3 pages 12 p. |
| Year: |
1995 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 7 of 8 found articles
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