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Journal description
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Details for article 127 of 187 found articles
| Title: |
On the scaling issues and high-κ replacement of ultrathin gate dielectrics for nanoscale MOS transistors |
| Author: |
Wong, Hei Iwai, Hiroshi |
| Appeared in: |
Microelectronic engineering |
| Paging: | Volume 83 (2006) nr. 10 pages 38 p. |
| Year: |
2006 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 127 of 187 found articles
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