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Journal description
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Details for article 135 of 141 found articles
| Title: |
Total ionizing dose response of fluorine implanted Silicon-On-Insulator buried oxide |
| Author: |
Potter, Kenneth Morgan, Katrina Shaw, Chris Ashburn, Peter Redman-White, William De Groot, C.H. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 54 (2014) nr. 9-10 pages 5 p. |
| Year: |
2014 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 135 of 141 found articles
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