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Details for article 134 of 141 found articles
| Title: |
Thermally-activated degradation of InGaN-based laser diodes: Effect on threshold current and forward voltage |
| Author: |
De Santi, C. Meneghini, M. Marioli, M. Buffolo, M. Trivellin, N. Weig, T. Holc, K. Köhler, K. Wagner, J. Schwarz, U.T. Meneghesso, G. Zanoni, E. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 54 (2014) nr. 9-10 pages 4 p. |
| Year: |
2014 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 134 of 141 found articles
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