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Journal description
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Details for article 7 of 21 found articles
| Title: |
Evolution of oxide charge trapping under bias temperature stressing |
| Author: |
Ang, D.S. Gu, C.J. Tung, Z.Y. Boo, A.A. Gao, Y. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 54 (2014) nr. 4 pages 19 p. |
| Year: |
2014 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 7 of 21 found articles
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