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Journal description
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Details for article 19 of 20 found articles
| Title: |
Two-dimensional transient simulations of the self-heating effects in GaN-based HEMTs |
| Author: |
Zhang, Yamin Feng, Shiwei Zhu, Hui Zhang, Jianwei Deng, Bing |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 53 (2013) nr. 5 pages 7 p. |
| Year: |
2013 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 19 of 20 found articles
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