|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 18 of 20 found articles
| Title: |
The impact of process-induced mechanical stress in narrow width devices and variable-taper CMOS buffer design |
| Author: |
Alam, Naushad Anand, Bulusu Dasgupta, S. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 53 (2013) nr. 5 pages 7 p. |
| Year: |
2013 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 18 of 20 found articles
| << previous | next >> |