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Journal description
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Details for article 13 of 27 found articles
| Title: |
Impact of high-power stress on dynamic ON-resistance of high-voltage GaN HEMTs |
| Author: |
Jin, Donghyun del Alamo, Jesús A. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 52 (2012) nr. 12 pages 5 p. |
| Year: |
2012 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 13 of 27 found articles
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