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                                       Details for article 23 of 31 found articles
 
 
  RTS noise characterization of HfO x RRAM in high resistive state
 
 
Title: RTS noise characterization of HfO x RRAM in high resistive state
Author: Puglisi, Francesco M.
Pavan, Paolo
Padovani, Andrea
Larcher, Luca
Bersuker, Gennadi
Appeared in: Solid-state electronics
Paging: Volume 84 (2013) nr. C pages 7 p.
Year: 2013
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 23 of 31 found articles
 
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