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Journal description
All volumes of the corresponding journal
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Details for article 22 of 31 found articles
| Title: |
RTN and BTI in nanoscale MOSFETs: A comprehensive statistical simulation study |
| Author: |
Amoroso, Salvatore Maria Gerrer, Louis Markov, Stanislav Adamu-Lema, Fikru Asenov, Asen |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 84 (2013) nr. C pages 7 p. |
| Year: |
2013 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 22 of 31 found articles
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